{'fraction_non_alphanumeric': 0.02889576883384933, 'fraction_numerical': 0.009287925696594427, 'mean_word_length': 5.024844720496894, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Long-Term Aging and Quick Stress Testing of 980-nm Single-Spatial Mode Lasers

Single-spatial mode lasers emitting at 980 nm are studied during continuous-wave long-term operation and ultra-high power short-term operation (stress-test) up to 13.5 W. We find that both tests eventually activate the same degradation mechanism, namely internal catastrophic optical damage. In the case of ultra-high power operation, we show that the mechanism that initializes this effect is a lateral widening of the optical mode, resulting in increased absorption outside the waveguide. Defects formed during long-term aging may eventually lead to the same effect. Stress testing allows for activation of several degradation mechanisms in a device one after the other and for distinguishing between mechanisms induced by aging and independent ones. Stress tests could pave the way toward more time-efficient testing, e.g., for comparison of different technology variants in development.