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Scaling analysis on plastic depinning of vortex matter at low temperature in an amorphous MoxGe1−x film

We measure current–voltage (I–V) characteristics in a weakly disordered vortex-lattice phase of an amorphous MoxGe1−x film at various temperatures T down to near T = 0 and perform a scaling analysis using recent simulations for a plastic depinning transition where a continuous velocity–force response is predicted. The collapse of the I–V data onto a scaling function is observed, whereas critical exponents derived via the scaling analysis are larger than the predicted ones. This discrepancy is partially attributed to the unexpectedly weak T dependence of the I–V characteristics at low T.