{'fraction_non_alphanumeric': 0.030560271646859084, 'fraction_numerical': 0.006791171477079796, 'mean_word_length': 5.276595744680851, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Applications of AES, XPS and TOF SIMS to phosphor materials

The important role of Auger electron spectroscopy (AES), X‐ray photo electron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (TOF‐SIMS) to characterize different phosphor materials is pointed out with examples. AES is used to monitor surface reactions during electron bombardment and also to determine the elemental composition of the surfaces of the materials, while XPS and TOF‐SIMS are used for the surface chemical composition and valence state of the dopants. Copyright © 2014 John Wiley & Sons, Ltd.