{'fraction_non_alphanumeric': 0.03398926654740608, 'fraction_numerical': 0.028622540250447227, 'mean_word_length': 4.828125, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Interfacial reaction and IMCs formation between Sn-0.7Cu solder and Cu substrate during reflow soldering

The interfacial reaction and growth of intermetallic compounds (IMCs) between the eutectic Sn-0.7 wt.% Cu solder and Cu substrate during soldering process were investigated experimentally. The Sn-0.7Cu/Cu couples were fabricated with soldering temperature varied at four levels of 300, 320, 340 and 360°C, while soldering time is varied at five levels between 5 and 90 min. Microstructural analysis is conducted to analyze the IMCs thickness and morphology. Two intermetallic phases were observed during soldering at the interface: η-phase (Cu6Sn5) and ε-phase (Cu3Sn) IMC layers, except for the solder joints which were fabricated at low temperature and/or short soldering time. The thickness of the η and ε IMC phases increase with increasing the soldering temperature and/or soldering time. It's found that the increase in total IMC layer thickness obeys a linear relationship with soldering temperature. And the relationship between X and T was given as X = 0.0866×T - 22.5 by means of linear fitting method.