{'fraction_non_alphanumeric': 0.017881705639614855, 'fraction_numerical': 0.0, 'mean_word_length': 5.222222222222222, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A general approach to analysis of distributed resistive structures

A new general method for calculation of thin-film-distributed resistive structures is presented. This method is based on the conformal mapping of the analyzed domain on the complex upper half-plane and the determination of the complex potential function as the solution of a boundary-values Volterra problem. Although the method inherently applies only to single-connected domains with known conformal representations on the upper half-plane, it may be extended also to other symmetrical multiple-connected configurations and in all cases when the positions of the conducting terminals in the upper half-plane are known. Two examples of application are given.