{'fraction_non_alphanumeric': 0.017991004497751123, 'fraction_numerical': 0.0, 'mean_word_length': 5.423076923076923, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Measurement method for low-contrast nonuniformity in liquid crystal displays by using multi-wavelet analysis

One of the visual problems hardest to recognize in liquid crystal displays (LCDs) is an area of non-uniform brightness called a mura. The accurate and consistent detection of a low-contrast mura is extremely difficult because the boundary between the regional mura and the background is indistinct. This paper presents a novel method for detection and quantitative measurement of low-contrast mura. Compared with some wavelet approaches, the multiple resolution analysis method based on the Symmetric Selesnick multiwavelet has advantages for practical use.