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Bayesian analysis of ceria nanoparticles from line profile data

A Bayesian/Maximum entropy (MaxEnt) method is applied to quantify the broadening of Xray line profiles in terms of the nanocrystallite size effects in ceria. The analysis is in general agreement with transmission electron microscopy results, while demonstrating the importance of appropriate a priori information needed in the method. The analysis also identifies other microstructural effects, such as the presence of dislocations and shape anisotropic effects, which may be influencing the size distributions determined from the Bayesian/MaxEnt method.