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CRYSTAL STRUCTURE DETERMINATIONS OF THREE-LAYER AURIVILLIUS CERAMICS USING A NEW PARALLEL BEAM X-RAY POWDER DIFFRACTOMETER

A new high-resolution parallel beam X-ray powder diffractometer incorporating multilayer X- ray optics in the incident and diffracted beams was constructed and used to refine the crystal structures of several three-layer Aurivillius ceramics using the Rietveld method. The intent of this study was to determine the feasibility of parallel beam data in a research environment. These results were compared to those previously obtained using a typical divergent beam diffractometer. In general, the refinement results were similar for both systems. However, the high-resolution data displayed statistically slightly larger a lattice parameters, and larger A-site Bond Valence Sum (BVS) values. The high- resolution data had much- improved signal to noise ratio and higher resolution.