{'fraction_non_alphanumeric': 0.014729950900163666, 'fraction_numerical': 0.0, 'mean_word_length': 5.954545454545454, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Investigation of semiconductor structures and two-dimensional systems by non-destructive contactless methods

In this paper the investigation of semiconductors by the high-frequency, magneto-optical and microwave methods is presented. These methods are based on the observation of the oscillation and resonance effects in semiconductors. The experimental data of determining transport and energy parameters of structures obtained in the observation of the Shubnikov-de Haas effect and nonlinear spin resonance due to stimulated combinational light scattering method with the signal amplification are considered.