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A scan pattern debugger for partial scan industrial designs

In this paper, we propose an implication graph based sequential logic simulator for debugging scan pattern failures encountered during First Silicon. A novel Debug Implication Graph (DIG) is constructed during logic simulation of the failing scan pattern. An efficient node traversal mechanism across time frames, in the DIG, is used to perform the root-cause analysis for the failing scan-cells. We have developed an Interactive Pattern Debug environment (IDE), viz. scan pattern debugger, around the logic simulator to systematically analyze and root-cause the failures. We integrated the proposed technique into the scan ATPG flow for industrial microprocessor designs. We were able to resolve the First Silicon logical pattern failures within hours, which would have otherwise taken a few days of manual effort.