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Time‐resolved synchrotron radiation x‐ray solution scattering study of DNA melting

Time resolved x‐ray solution scattering measurements were made during thermal denaturation of DNA from various sources in the temperature range of 20–90°C. Preliminary results on the influence of fragement length, ionic strength, and origin of the DNA on the time course of the scattering are described. Interpretation is based on model calculations of the scattering patterns. The resluts indicate that, for long DNA fragments at very low ionic strength, the melting process is a continuous phenomenon over the whole temperature range. It is accompanied by a progressive decrease of the radius of gyration of the cross section and of the mass per unit length. For short fragments of 146 base pair nucleosomal core DNA, stiffening of the DNA appears to precede a sharp melting transition.