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The influence of the Coulomb interaction in electron bunch on the structural parameters determined by time-resolved electron diffraction

Transition to temporal resolution on the order of 1 ps or less raises a number of questions associated with estimation of the accuracy of the dynamic parameters based on the analysis of time-dependent scattering intensity. The use of ultrashort pulses leads to the necessity for increasing the total exposure time and lengthening the time of data acquisition. This can be to some extent mitigated by increasing the charge per pulse. Increasing in the number of electrons, however, is limited by the Coulomb repulsion between them, which leads on one hand, to distortion of the diffraction pattern, and the other hand to increase the duration of the pulse. The analytical technique for estimating the deformation of the diffraction pattern caused by the Coulomb repulsion of the electrons in the electron bunch with duration of less than 10 ps, and the influence of this effect on the accuracy of determination of the interatomic distances is developed.