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The role of associative ionization reactions in the memory effect of atmospheric pressure Townsend discharges in N2 with a small O2 addition

In this work, we investigate the role played by associative ionization reactions in the memory effect of atmospheric pressure Townsend dielectric barrier discharges working in N2 with a small addition of O2. Systematic laser-induced fluorescence measurements are carried out in order to provide the absolute densities of N and O atoms and NO molecules for different oxygen concentrations. The use of these data in a dedicated model allows us, in particular, to estimate the rate of the reaction N(2P)+O(3P)→NO++e suspected of playing a significant role. According to the obtained results, this reaction is found responsible for a significant enhancement in the production of seed electrons between two successive discharges at 25 ppm of O2, in good agreement with experimental observations. It confirms the importance of this associative ionization reaction in these experimental conditions.