{'fraction_non_alphanumeric': 0.026986506746626688, 'fraction_numerical': 0.01649175412293853, 'mean_word_length': 5.958333333333333, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
21.3: Reconstruction Characteristics of MgO (111) Textured Protective Layer by Over‐Frequency Accelerated Discharge in ACPDPs

The reconstruction characteristics of MgO (111) textured protective layer and the influences of silicon and MgO seed particle in AC‐PDP were investigated by over‐frequency accelerated discharge and these were correlated to the variations of electronic structures. The reconstruction and exaggerated grain growth (EGG) were closely correlated with the partial pressure of evaporated MgO in plasma space and explained by defect‐assisted 2‐D and/or 3‐D nucleation and growth of charged clusters during discharge under electric field in AC‐PDP.