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XPS, Static SIMS and NEXAFS Spectroscopic Investigation of Thiol Adsorption on Metals and Metal Sulfides

Examples are presented of the complementary nature of conventional XPS, synchrotron XPS, ToF-SIMS and NEXAFS spectroscopy when applied to the adsorption of MBT on metals and metal sulfides. Conventional XPS could detect chemisorption via S 2p spectra, detect the onset of multilayer formation via the relevant metal Auger or core level photoelectron spectra, and determine metal thiolate stoichiometry from thick multilayers. Surface-optimised synchrotron XPS allowed precise chemisorbed MBT S 2p binding energies to be obtained. Angle-dependent N and C NEXAFS spectra revealed adsorbate orientation, even for an abraded but relatively smooth surface. Cu L 3 -edge spectra detected some Cu(II) and hence Cu(MBT) 2 in multilayers on chalcocite. Static SIMS data confirmed the interaction of both N and exocyclic S with surface metal atoms for silver metal and chalcocite.