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Object Instance Profiling

Existing Java profilers mostly use one of two distinct profiling methods, sampling and instrumentation. Sampling is not as informative as instrumentation but the overall overhead can be small. Instrumentation is more informative than sampling, since it intercepts every entrance and exit in the measured code, but the overhead is large. In this paper, we propose a method that collects profiling information associated with a specific object instance, rather than with a specific code location. Our method, called object instance profiling, can collect contextual information similarly to other instrumentation methods, but can be used more selectively and therefore with lesser overhead.