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The possibility of re-entrant phenomena induced by a transverse field in ultra-thin transverse Ising films

The phase diagrams and temperature dependences of magnetizations in ultra-thin transverse Ising thin films are studied by the use of both the effective-field theory with correlations (EFT) and the mean-field theory (MFA). Novel features, such as the possibility of re-entrant phenomena, are obtained for the magnetic properties in such systems with a zero transverse field at the surfaces, when the EFT is applied to them, although such features could not be found from the use of the MFA. When the transverse field at the surfaces takes a finite value, however, the re-entrant phenomena could not be found from the both formulations of the EFT and the MFA. Similar phenomena are then obtained in the phase diagrams by using the MFA and the EFT.