{'fraction_non_alphanumeric': 0.013435700575815739, 'fraction_numerical': 0.0, 'mean_word_length': 5.525, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Surface investigations using the positron reemission microscope.

We have constructed the first positron reemission microscope and taken images of a number of targets using it. The unique image contrast of this device is determined by the probability that positrons are reemitted from a specimen surface. The surface and near-surface defect sensitivity of the positron reemission microscope is demonstrated, as well as the feasibiltiy of imaging biological specimens and semiconductor devices. Applications are discussed.