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Conductive anodic filaments (CAF): An electrochemical failure mechanism of reinforced polymeric dielectrics

An electrochemical failure mechanism (CAF) of rigid polymeric dielectrics has been discussed. The life of a printed-circuit board composed of CAF - susceptible material is a function of temperature, humidity and applied bias. Although an electrochemical corrosion of the metallic conductors is the ultimate result of the process, the integrity of the resin/glass interface may be the life-limiting property of the material.