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Two Bayesian methods for junction classification

We propose two Bayesian methods for junction classification which evolve from the Kona method: a region-based method and an edge-based method. Our region-based method computes a one-dimensional (1-D) profile where wedges are mapped to intervals with homogeneous intensity. These intervals are found through a growing-and-merging algorithm driven by a greedy rule. On the other hand, our edge-based method computes a different profile which maps wedge limits to peaks of contrast, and these peaks are found through thresholding followed by nonmaximum suppression. Experimental results show that both methods are more robust and efficient than the Kona method, and also that the edge-based method outperforms the region-based one.