{'fraction_non_alphanumeric': 0.011534025374855825, 'fraction_numerical': 0.002306805074971165, 'mean_word_length': 5.244604316546763, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
The impact of system impedance on the characterization of high power devices

This paper focuses on the extension of the successful application of current and voltage waveform engineering of on-wafer devices to power levels relevant to both handset and basestation markets. Effects on the measured waveforms caused by a 50Omega characteristic impedance of the measurement system are investigated showing a significant effect at the lower and crucially at higher harmonics, which is in contrast to the current school of thought. For the first time a waveform based analysis of packaging affects is presented, allowing the effects of the system's higher harmonic impedances to be studied and considered in the context of de-embedding measured waveforms. Measured de-embedded waveforms are compared with simulated equivalents model and are found to be in good agreement.