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Understanding Complex Microstructures With High-Resolution Microanalysis in the Transmission Electron Microscope.

The development of intermediate voltage transmission electron microscopes equipped with fieldemission sources, have made analytical transmission electron microscopy (TEM) a widely used tool in the characterization of fine microstructures. In the general area of metallography, however, TEM is often considered as a tool of last resort to characterize complex materials because of the difficulty associated with sample preparation and limited sampling of the microstructures. With access to new sample preparation tools such as the focused ion beam (FIB), metallographic analysis of samples by TEM is likely to become a routine tool to elucidate not only complex materials but also microstructural and chemical nature of materials subjected to environmental degradation. Specific regions in welded microstructures or areas showing preferential corrosion can be selected and analyzed at high spatial resolution. In this short abstract some examples illustrate the possibilities of identifying features in such complex microstructures that would not have been possible without making use of the high spatial resolution analysis available in analytical TEM. Previous work has shown the potential of TEM and FIB to identify the response of various phases to electrochemical noise tests in saline water.