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Approximate SRAMs With Dynamic Energy-Quality Management

In this paper, approximate SRAMs are explored in the context of error-tolerant applications, in which energy is saved at the cost of the occurrence of read/write errors (i.e., signal quality degradation). This analysis investigates variation-resilient techniques that enable dynamic management of the energy-quality tradeoff down to the bit level. In these techniques, the different impacts of errors on quality at different bit positions are explicitly considered as key enabler of energy savings that are far larger than a simple voltage scaling. The analysis is based on the experimental results in an energy-quality scalable 28-nm SRAM and the extrapolation to a wide range of conditions through the models that combine the individual energy contributions. Results show that the joint adoption of multiple bit-level techniques provides substantially larger energy gains than individual techniques. Compared with the simple voltage scaling at isoquality, the joint adoption of these techniques can provide more than $2\times $ energy reduction at negligible area penalty. Energy savings turn out to be highly sensitive to the choice of joint techniques, thus showing the crucial importance of dynamic energy-quality management in approximate SRAMs.