{'fraction_non_alphanumeric': 0.02294792586054722, 'fraction_numerical': 0.0, 'mean_word_length': 5.75, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Superresolution techniques in optoelectronic imaging systems

We analyze superresolution techniques in optoelectronic imaging systems. Sampling is necessity in optoelectronic imaging systems. Aliasing will occur when sampling an object containing frequencies exceeding half the sampling rate, i.e., high frequencies will overlap with low frequencies and significantly degrade image quality. The schemes of expanding the unaliased bandwith and recovering the aliased high frequencies are referred to as superresolution techniques here, including techniques of microscanning (MS), microzooming (MZ) and dual-magnification (DM). They all exploit series of frames of the same object, but different in image acquisition and processing. MS using subpixel shift frames is simple in reconstruction, but complex in shift machine. MZ using different magnification frames is less complex in machinery, but needs data processing in spectrum. DM can achieve the results similar to MS or MZ with fewer undersampled frames, but only suitable to periodic targets. Theoretical comparison and computer simulations about these techniques are presented.