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Optoelectronic oscillator-based interrogation system for Michelson interferometric sensors

High-performance interrogation systems for optical fiber sensors are extensively required for environmental condition monitoring applications. In this article, we propose and demonstrate a Michelson interferometer (MI) interrogation system based on an optoelectronic oscillator (OEO). The frequency of the OEO is related to the free spectral range (FSR) of the MI. Thus, when the FSR of the MI varies with a change in external physical factors, the frequency of the OEO shifts and can be used for interrogation. We demonstrate that the temperature sensitivity and interrogation resolution are 35.35 MHz/°C and 0.012 °C, respectively. Such an OEO-based scheme enables wavelength-to-frequency mapping and promises a wide linear interrogation range, high resolution and high-speed interrogation.