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Relationship between Raman Spectra and Crystallinity of CdS Films Grown by Cathodic Electrodeposition

CdS films were cathodically electrodeposited from acidic solutions (pH=2.5) containing CdSO4 and Na2S2O3. Raman scattering of these films was measured using the 514.5 nm line of an Ar ion laser as the light source. The longitudinal-optical (LO) phonon peak of CdS was observed between 300–310 cm-1. The full width at half-maximum (FWHM) of the peak was a large value of 18.2 cm-1 for as-deposited films, but decreased to 12.7 cm-1 after the films were annealed at 500° C. These results are consistent with those of other structural and optical characterizations, and thus the Raman spectroscopy was found to be useful for the characterization of the electrodeposited CdS films.