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MOSFET modeling for analog circuit CAD: Problems and prospects

The requirements for good MOSFET modeling as they apply to usage in analog and mixed analog-digital design are discussed. A set of benchmark tests that can be easily performed is given, and it is argued that most CAD (computer-aided design) models today fail such tests even for simple, long-channel devices at room temperature. A number of other problems are discussed, and in certain cases specific cures are suggested. The issue of parameter extraction is addressed. Finally, the context of model development and usage is considered, and it is argued that some of the factors responsible for the problems encountered in the modeling effort are of a nontechnical nature.