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Electrostatic Sensitivity Test of Semiconductor Device

The electrostatic sensitivity of triode 2SC3358 has been tested by completely step method. By using strict calculation, we have found the damage threshold voltage distribution of CB junction of the semiconductor device observe normal distribution, the confidence interval about average value of the damage voltage under a confidence level at 90% is (1095.6V, 1256.8V) and the standard deviation is 235.7V. The analysis of the distribution of damage probability about electrostatic sensitive device has important significance for improving the reliability of electrostatic sensitive system.