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Adaptive atomic force microscope

Commercial atomic force microscope (AFM) solutions do not typically lend themselves to easy integration into a wide range of optical microscope platforms. Here we present a custom AFM platform which is readily integrated into an FPGA controlled fluorescence microscope and is easily programmed for a variety of unique applications. Our collimated laser design allows for an adjustable sensitivity depending on the range of forces required, and the large range piezo (100μm in all three dimensions) presents the freedom to perform precise measurement and manipulation in a high throughput manner, over a broad range of distances. We demonstrate a high bandwidth of 1MHz with low noise levels of less than 71pN at full bandwidth and below 6pN at a relevant bandwidth of 1kHz.