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Imaging-based NDT Methods for Electronic Devices

This paper reviews the non-destructive testing (NDT) methods used for electronic devices inspection. The C-mode scanning acoustic microscopy, X-ray, scanning electron microscope and infrared thermography are the most widely used NDT techniques in electronic devices testing and inspection. The typical testing scenarios are discussed along with merits and drawbacks for each technique. Newly developed NDT methods are introduced and the challenges/opportunities of NDT&E for electronic devices are provided.