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Reliability Determination of Nanoelectronic Devices Using Semi-Marcov Processes

Abstract The main purpose of the article is to investigate the reliability process of nanoelectronics devices. Firstly, the research problem is presented based on foreign data source. Then, the analytical method has been chosen – semi-Marcov processes. Next, according to the adopted method and input data, the operating process has been analyzed. Finally, the probabilities of objects being in particular operating states, e.g. in the state of failure-free operation have been determined.