{'fraction_non_alphanumeric': 0.015296367112810707, 'fraction_numerical': 0.0, 'mean_word_length': 5.313253012048193, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Predicting service life of bypass diodes in photovoltaic modules

Service life model for bypass diodes is a critical step towards developing service life models for PV modules. A review of failure mechanisms in bypass diodes along with the accelerated tests that could replicate them is presented. Susceptibility of commercially available bypass diodes for thermal runaway was studied. Accelerated tests were performed to study the diode wear out by High Temperature Forward Bias (HTFB) and Thermal Cycling (TC) mechanisms.