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The application of stereo‐techniques to electron micrographs

It is demonstrated that the only requisite for a true three‐dimensional image is the presence of parallax in the stereo‐pair. This parallax is introduced into electron micrographs by tilting the specimen between exposures. After deriving the usual parallax equation several examples of the use of stereo‐measurements in electron microscopy illustrate the extra information retrieved by its use.