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Implementation of 1.6 Tb s−1 truly random number generation based on a super-luminescent emitting diode

Using a super-luminescent emitting diode (SLED) source with a linewidth of more than 60 nm, we realize truly random number generation up to 100 Gb s−1 by directly measuring the intensity noise, which originates from the fluctuations of spontaneous emissions. Furthermore, we propose a post-processing method in an over-sampling scheme by eliminating the correlation between adjacent samples, and achieve an ultra-high truly random number generation rate of 1.6 Tb s−1. The randomness of the generated bit stream is verified using standard statistical test suites (Diehard and NIST-STS), and evaluated using a three-standard-deviation criterion and Shannon entropy estimation.