b c d a e f Figure 5: X-ray diffraction used to determine the pseudocubic lattice parameters of the LNO films. a,b Extended (0 0 L ) scan and data near the (0 0 2) peak are used to determine the c -axis parameter of the LNO film grown on LAO. c,d Extended (0 0 L ) scan and data near the (0 0 2) peak are used to determine the c-axis parameter of the LNO film grown on STO. e, Reciprocal space maps taken near the (2 2 1.946) condition confirm that the film grown on LAO is strained. f, Reciprocal space maps taken near the (2 2 2.05) condition confirm that the film grown on STO is strained. In all cases, the reciprocal lattice units are set to those of the substrate. 17