FIG. 3: (color online). Pole figure measurements of the LuNi$_{2}$B$_{2}$C (112) reflection of the four films from Fig. 2 at 2 θ = 40.05 ° (Cu K$_{α}$). The z–axis is scaled linearly and normalized for each measurement. Only one quadrant is shown due to the in–plane symmetry of the borocarbide crystal. The films exhibit almost perfect in–plane order. This indicates an epitaxial relationship between the substrate and the borocarbide in the following way: (110)[010]$_{MgO}$ || (010)[010]$_{LuNi}$$_{2}$$_{B}$$_{2}$$_{C}$ (1) In agreement with the results of Fig. 2, the intensity of the borocarbide (112) peak is strongly enhanced for higher deposition temperatures while a full width of half maximum (FWHM) of the phi scan of about 2 ° is almost preserved. It should be noted further at this place that also the Lu$_{2}$O$_{3}$ interface layer has an epitaxial relationship to the substrate, which can be described as (110)[010]$_{MgO}$ || (110)[010]$_{Lu}$$_{2}$$_{O}$$_{3}$ . (2) A further improvement of the film quality was achieved using lower laser repetition rates. LuNi$_{2}$B$_{2}$C films with the best out–of–plane and in–plane texture were prepared with a frequency of 5 Hz under slightly optimized conditions. In Fig. 4, a phi scan of the (112) pole of such the sample is shown: The FWHM is about 1 ° only, which is the lowest value reported so far on borocarbide thin films. The out–of–plane alignment has a FWHM value about 2.5 ° (not shown). Taking into account the low background signal, these data testify an extremely high in-plane order achieved under these optimized deposition conditions compared to earlier 7