Perovskite oxide materials have drawn plenty attention due to their abundant phases which can be tuned by altering chemical doping and/or different external stimuli. For ex- ample, pure SrTiO 3 (STO) is a paraelectric insulator but when doped with small amount of Nb or oxygen vacancies, it converts to a high-mobility metal [1]. It was also demonstrated that the room temperature (RT) ferroelectric phase could be achieved in a strained thin film [2]. Recently, interfaces of epitaxial perovskite oxides exhibited many new phases not ob- served in the bulk constituents on either side of the interfaces. Examples are: spin rearrange- ment, orbital reconstruction and covalent bonding at interface between La 2 / 3 Ca 1 / 3 MnO 3 and YBa 2 Cu 3 O 7 [3, 4]; superconducting interface between cuprate insulator and metal [5]; and highly mobile 2D electron gas at the interface of insulating LaAlO 3 and SrTiO 3 [6]. Though many reports pointed out the perovskite oxide interfaces could exhibit new phases, a mature direct local probe of the electronic properties right at the interface is still lacking. It has been demonstrated that the cross-sectional scanning tunneling microscopy (XSTM) can be used to map the band bending across a semiconductor interface for more than a decade [7]. Recently, Basletic et al. demonstrated that the metallic states localized at an oxide inter- face could be probed with the conducting atomic force microscope on sample cross-sections that were mechanically polished [8]. Here we demonstrate that fracturing the oxide samples routinely results in atomically flat surfaces. The morphology survey shown here infers that the capabilities of XSTM with high spatial resolution imaging, while concurrently probing the local density of states, at oxide interfaces to be very promising. It is well known that the perovskite oxide materials do not have a well-defined cleavage plane. Thus, cleaving is not an accurate way to describe our cross-sectional studies, but rather that the samples are fractured. Traditionally, for STO, to prepare fresh surfaces, chemical etching or annealing in different environments were commonly used (see ref. [9] and references therein). Recently, we have achieved preliminary STM studies of pristine Nb-doped STO (Nb:STO) surfaces by a novel fracturing procedure [10, 11]. Here, we sum- marized the possible surface morphologies observed in the samples fractured with this novel procedure. All of the samples tested here are commercial Nb:STO, purchased from Crystec. The sample dimensions used in our experiments can be mainly sorted into two categories with size of either ∼ 5.0 × 2.0 × 0.5 mm 3 or ∼ 10 × 2.5 × 1.0 mm $^{3}$. The samples were scribed from back or from side, in order to vary the fracturing directions from [001] or from [100], respectively. 2