Design Overlay Columns: 1- 74 Control . . Source overlay.....STATIONERY *...+....1....+....2....+....3....+....4....+....5....+....6....+....7.... 001 002 003 004 005 %L002 -------------------------- 006 007 008 009 010 011 012 More... Define Line Mark......:*L002 Measurement method....:Row/Column Start position . . Across 19 Down 5 End position . . . Across 50 F3=Exit F4=Detail F6=Change measurement method F12=Cancel F24=More keys The following table explains each field in this display. Field Name Description Control You can move the list view window by entering one of the following commands in this field and pressing Enter. -n Backward The image area moves n lines toward the top line of the overlay, the record layout, or the page layout. +n Forward The image area moves n lines toward the bottom line of the overlay, the record layout, or the page layout. W-n Left The image area moves n columns toward the first column of the overlay, the record layout, or the page layout. W+n Right The image area moves n columns toward the last column of the overlay, the record layout, or the page layout. n The image area moves to the nth line. Wn The image area moves to the nth column. *TOP The image area moves to the top line. *BOT The image area moves to the bottom line. Mark The element mark is displayed in this field. It could be either a system-assigned mark or a user-assigned name. Measurement method This field shows the measurement method used to specify the position. You may change this field by pressing the F6 key. Start position The position parameter consists of across and down values. These values specify the horizontal and vertical start position of the element being defined. 250 AFP Utilities for iSeries: User’s Guide