Mesoscopic electronic heterogeneities in the transport properties of   V2O3 thin films
  The spectacular metal-to-insulator transition of V2O3 can be progressively suppressed in thin film samples. Evidence for phase separation was observed using microbridges as a mesoscopic probe of transport properties where the same film possesses domains that exhibit a metal-to-insulator transition with clear first order features or remain metallic down to low temperatures. A simple model consisting of two parallel resistors can be used to quantify a phase coexistence scenario explaining the measured macroscopic transport properties. The interaction between film and substrate is the most plausible candidate to explain this extended phase coexistence as shown by a correlation between the transport properties and the structural data. 
C. Grygiel, A. Pautrat, W.C. Sheets, W. Prellier, B. Mercey, L. Mechin