Nanomachining of mesoscopic graphite
  An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed. 
P. Barthold, T. Luedtke, R. J. Haug