Electromagnetic and strong contributions to dAu soft coherent inelastic   diffraction at RHIC
  We estimate electromagnetic (ultra-peripheral) and strong contributions to dAu soft coherent inelastic diffraction at RHIC, dAu \to X Au. We show that the electromagnetic contribution is the dominant one and that the corresponding cross section is sizable, \sigma^{dAu \to XAu}_{\rm e.m.}=214 mb, which constitutes 10% of the total dAu inelastic cross section. 
V. Guzey (Jefferson Lab) and M. Strikman (Penn State U.)