Double-blind test program for astrometric planet detection with Gaia
  We use detailed simulations of the Gaia observations of synthetic planetary systems and develop and utilize independent software codes in double-blind mode to analyze the data, including statistical tools for planet detection and different algorithms for single and multiple Keplerian orbit fitting that use no a priori knowledge of the true orbital parameters of the systems. 1) Planets with astrometric signatures $\alpha\simeq 3$ times the single-measurement error $\sigma_\psi$ and period $P\leq 5$ yr can be detected reliably, with a very small number of false positives. 2) At twice the detection limit, uncertainties in orbital parameters and masses are typically $15%-20%$. 3) Over 70% of two-planet systems with well-separated periods in the range $0.2\leq P\leq 9$ yr, $2\leq\alpha/\sigma_\psi\leq 50$, and eccentricity $e\leq 0.6$ are correctly identified. 4) Favorable orbital configurations have orbital elements measured to better than 10% accuracy $> 90%$ of the time, and the value of the mutual inclination angle determined with uncertainties $\leq 10^{\degr}$. 5) Finally, uncertainties obtained from the fitting procedures are a good estimate of the actual errors. Extrapolating from the present-day statistical properties of the exoplanet sample, the results imply that a Gaia with $\sigma_\psi$ = 8 $\mu$as, in its unbiased and complete magnitude-limited census of planetary systems, will measure several thousand giant planets out to 3-4 AUs from stars within 200 pc, and will characterize hundreds of multiple-planet systems, including meaningful coplanarity tests. Finally, we put Gaia into context, identifying several areas of planetary-system science in which Gaia can be expected to have a relevant impact, when combined with data coming from other ongoing and future planet search programs. 
S. Casertano (1), M.G. Lattanzi (2), A. Sozzetti (2,3), A. Spagna (2),   S. Jancart (4), R. Morbidelli (2), R. Pannunzio (2)...