Analysis of the 3D distribution of self-assembled stacked quantum dots   by electron tomography
  This paper has been withdrawn by the authors. The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shape specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only a 3D analysis allows an accurate correlation between the growth design and the structural characteristics. 
Jes\'us Hern\'andez-Saz, Miriam Herrera, Diego Alonso-\'Alvarez and   Sergio I. Molina
cond-mat.mtrl-sci