Measurement of the coupling between applied stress and magnetism in a   manganite thin film
  We measured the magnetization depth profile of a (La1-xPrx)1-yCayMnO3 (x = 0.60\pm0.04, y = 0.20\pm0.03) film as a function of applied bending stress using polarized neutron reflectometry. From these measurements we obtained a coupling coefficient relating strain to the depth dependent magnetization. We found application of compressive (tensile) bending stress along the magnetic easy axis increases (decreases) the magnetization of the film. 
Surendra Singh, M. R. Fitzsimmons, T. Lookman, H. Jeen, A. Biswas, M.   A. Roldan and M. Varela
cond-mat.mtrl-sci cond-mat.str-el