Mixing of Edge States at a Bipolar Graphene Junction
  An Atomic Force Microscope is used to locally manipulate a single layer graphene sheet. Transport measurements in this region as well as in the unmanipulated part reveal different charge carrier densities while mobilities stay in the order of 10000 cm^2/(Vs). With a global backgate, the system is tuned from a unipolar n-n' or p-p' junction with different densities to a bipolar p-n junction. Magnetotransport across this junction verifies its nature, showing the expected quantized resistance values as well as the switching with the polarity of the magnetic field. The mixing of edge states at the p-n junction is shown to be supressed at high magnetic fields. 
H. Schmidt, J. C. Rode, C. Belke, D. Smirnov, and R. J. Haug
cond-mat.mes-hall