Calculation of divergent photon absorption in ultrathin films of a   topological insulator
  We perform linear and non-linear photon absorption calculations in topological insulator ultra-thin films on a substrate. Due to the unique band structure of the coupled topological surface states, novel features are observed for suitable photon frequencies, including a divergent edge singularity in one-photon absorption process and a significantly enhancement in two-photon absorption process. The resonanct frequencies can be controlled by tuning the energy difference and coupling of the top and bottom surface states. Such unique linear and nonlinear optical properties make ultra-thin films of topological insulators promising material building blocks for tunable high-efficiency nanophotonic devices. 
Jing Wang, Hideo Mabuchi, Xiao-Liang Qi
cond-mat.mes-hall cond-mat.mtrl-sci quant-ph