Precision measurement of charge number with optomechanically induced   transparency
  We propose a potentially practical scheme to precisely measure the charge numbers of small charged objects by optomechanical systems using optomechanically induced transparency (OMIT). In contrast to the conventional measurements based on the noise backaction on the optomechanical systems, our scheme makes use of the small deformation of the mechanical resonator sensitive to the charge number of the nearby charged object, which could achieve the detection of a single charge. The relationship between the charge number and the window width of the OMIT is investigated and the feasibility of the scheme is justified by numerical simulation using currently available experimental values. 
Jian-Qi Zhang, Yong Li, Mang Feng, Yi Xu
quant-ph physics.optics