Efficient Quasiparticle Evacuation in Superconducting Devices
  We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles. 
Sukumar Rajauria, L. M. A. Pascal, Ph. Gandit, F. W. J. Hekking, B.   Pannetier, and H. Courtois
cond-mat.mes-hall