A Monte Carlo study of the fluctuations in Xe electroluminescence yield:   pure Xe vs Xe doped with CH4 or CF4 and planar vs cylindrical geometries
  Monte Carlo simulation is used to investigate the fluctuations in the Xe proportional electroluminescence (EL) yield H (also known as secondary scintillation) produced by sub-ionization primary electrons drifting in the gas under appropriate electric fields, comparing pure Xe gas with Xe doped with CH4 or CF4. The work is modeled on gas detectors of the gas proportional-scintillation type, where amplification is achieved through the production of EL under a charge-multiplication free regime. The addition of the molecular gases to Xe reduces electron diffusion, a desirable effect in large size detectors where primary electrons drift across a long absorption/drift region. However, the presence of the molecules reduces H and increases its fluctuations. In the case of CF4, the effects are very strong due to significant electron attachment in the EL field range, ruling out CF4 as an acceptable additive. The addition of CH4 affects H and its fluctuations to a much lower extent, and CH4 concentrations lower than ~1% may be an appropriate choice. In addition, Monte Carlo calculations in pure Xe under cylindrical geometry in a regime below charge multiplication have shown that fluctuations in the EL yield H are an order of magnitude higher than for planar geometry. For both geometries, though, the fluctuations have a negligible effect on the energy resolution, and variations of the anode radius in cylindrical geometry or grid parallelism in planar geometry may be a more significant cause of concern. 
J. Escada, T.H.V.T. Dias, F.P. Santos, P.J.B.M. Rachinhas, C.A.N.   Conde and A.D. Stauffer
physics.ins-det