Preparation and ferroelectric properties of (124)-oriented SrBi4Ti4O15   ferroelectric thin film on (110)-oriented LaNiO3 electrode
  A (124)-oriented SrBi4Ti4O15 (SBTi) ferroelectric thin film with high volume fraction of {\alpha}SBTi(124)=97% was obtained using a metal organic decomposition process on SiO2/Si substrate coated by (110)-oriented LaNiO3 (LNO) thin film. The remanent polarization and coercive field for (124)-oriented SBTi film are 12.1 {\mu}C/cm2 and 74 kV/cm, respectively. No evident fatigue of (124)-oriented SBTi thin film can be observed after 1{\times}10e9 switching cycles. Besides, the (124)-oriented SBTi film can be uniformly polarized over large areas using a piezoelectric-mode atomic force microscope. Considering that the annealing temperature was 650{\deg}C and the thickness of each deposited layer was merely 30 nm, a long-range epitaxial relationship between SBTi(124) and LNO(110) facets was proposed. The epitaxial relationship was demonstrated based on the crystal structures of SBTi and LNO. 
Xi Wang, Pilong Wang, Guangda Hu, Jing Yan, Xuemei Chen, Yanxia Ding,   Weibing Wu, Suhua Fan
cond-mat.mtrl-sci