Short-range defects contribution to the monolayer graphene resistivity
  The derived by us earlier electron scattering matrix for the short-range defects in monolayer graphene is applyed to description of the resistivity electron density dependence. It is argued that large charged defect density is unlikely in the suspended graphene and graphene lying above the trench. 
Natalie E. Firsova, Sergey A. Ktitorov
cond-mat.mes-hall