Electrical Characterization of SiPM as a Function of Test Frequency and   Temperature
  Silicon Photomultipliers (SiPM) represent a promising alternative to classical photomultipliers, for instance, for the detection of photons in high energy physics and medical physics. In the present work, electrical characterizations of test devices - manufactured by ST Microelectronics - are presented. SiPMs with an area of 3.5x3.5 micron^2 and a cell pitch of 54 micron were manufactured as arrays of 64x64 cells and exhibiting a fill factor of 31%. The capacitance of SiPMs was measured as a function of reverse bias voltage at frequencies ranging from from 20 Hz up to 1 MHz and temperatures from 300 K down to 85 K. While leakage currents were measured at temperatures from 400 K down to 85 K. Thus, the threshold voltage - i.e., voltage corresponding to that at which the multiplication regime for the leakage current begins - could be determined as a function of temperature. Finally, an electrical model suited to reproduce the dependence of the frequency dependence of capacitance is presented. 
M. J. Boschini, C. Consolandi, P. G. Fallica, M. Gervasi, D. Grandi,   M. Mazzillo, S. Pensotti, P. G. Rancoita, D. Sanfilip...
physics.ins-det astro-ph.IM hep-ex