Charge fluctuations in single-electron tunneling oscillations
  It has been predicted that in the presence of a sufficiently high-dissipative environment transport in a small tunnel junction can become extremely regular, giving rise to the phenomenon of single-electron tunneling oscillations. Recent progress in detection of high-frequency current fluctuations and the interest in single-electron sources motivate further investigations on the expected accuracy of the charge oscillations as a function of the impedance of the environment. In this paper we study theoretically the charge-fluctuation spectrum at finite frequency for the system at hand, and investigate its evolution as a function of the external impedance. The evolution and the disappearance of the single-electron oscillations peak is described by analytical and numerical methods. 
Carlotta Negri (LOMA), Fabio Pistolesi (LOMA)
cond-mat.mes-hall