Steady-state cracking in brittle substrates beneath adherent films:   revisited
  This is a technical note aiming at the re-examination of the phenomenon of the steady-state cracking in the two-layer system. The method of Suo and Hutchinson, as introduced in their 1989 paper, is followed. Our solution is compared with the one appearing in that paper for the substrate-to-film thickness ratio $\lambda_0=10$. We obtain results at three $\lambda_0<10$ values. Combined with the results for $\lambda_0=10$, the new sets of values cover thickness ratios between 1 and 10, sufficient for determining crack initiation and propagation in almost every relevant problem. We present our results in tables (and figures), thus facilitating their implementation and use. 
Evangelos Matsinos
cond-mat.mtrl-sci