Near-Field Scanning Microwave Microscopy: Measuring Local Microwave   Properties and Electric Field Distributions
  We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields. 
B. J. Feenstra, C. P. Vlahacos, Ashfaq S. Thanawalla, D. E.   Steinhauer, S. K. Dutta, F. C. Wellstood and Steven M. Anlage ...