Correction of SOHO CELIAS/SEM EUV Measurements saturated by extreme   solar flare events
  The solar irradiance in the Extreme Ultraviolet (EUV) spectral bands has been observed with a 15 sec cadence by the SOHO Solar EUV Monitor (SEM) since 1995. During remarkably intense solar flares the SEM EUV measurements are saturated in the central (zero) order channel (0.1 -- 50.0 nm) by the flare soft X-ray and EUV flux. The first order EUV channel (26 -- 34 nm) is not saturated by the flare flux because of its limited bandwidth, but it is sensitive to the arrival of Solar Energetic Particles (SEP). While both channels detect nearly equal SEP fluxes, their contributions to the count rate is sensibly negligible in the zero order channel but must be accounted for and removed from the first channel count rate. SEP contribution to the measured SEM signals usually follows the EUV peak for the gradual solar flare events. Correcting the extreme solar flare SEM EUV measurements may reveal currently unclear relations between the flare magnitude, dynamics observed in different EUV spectral bands, and the measured Earth atmosphere response. A simple and effective correction technique based on analysis of SEM count-rate profiles, GOES X-ray, and GOES proton data has been developed and used for correcting EUV measurements for the five extreme solar flare events of July 14, 2000, October 28, November 2, November 4, 2003, and January 20, 2005. Although none of the 2000 and 2003 flare peaks were contaminated by the presence of SEPs, the January 20, 2005 SEPs were unusually prompt and contaminated the peak. The estimated accuracy of the correction is about 7.5% for large X-class events. 
L.V. Didkovsky (1), D.L. Judge (1), A.R. Jones (1), S. Wieman (1),   B.T. Tsurutani (2), and D. McMullin (3) ((1) University...