Low-Temperature Optical Characterization of Single CdS Nanowires
  We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states. 
L. V. Titova, Thang B. Hoang, H. E. Jackson, L.M. Smith, J.M.   Yarrison-Rice, J.L. Lensch and L.J. Lauhon