Combined scanning force microscopy and scanning tunneling spectroscopy   of an electronic nano-circuit at very low temperature
  We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed. 
Julien Senzier (CRTBT), Pengshun S. Luo (CRTBT), Herv\'e Courtois   (CRTBT)