A novel method for unambiguous ion identification in mixed ion beams   extracted from an EBIT
  A novel technique to identify small fluxes of mixed highly charged ion beams extracted from an Electron Beam Ion Trap (EBIT) is presented and practically demonstrated. The method exploits projectile charge state dependent potential emission of electrons as induced by ion impact on a metal surface to separate ions with identical or very similar mass-to-charge ratio. 
W. Meissl, M. C. Simon, J. R. Crespo Lopez-Urrutia, H. Tawara, J.   Ullrich, HP. Winter, and F. Aumayr