Effects of Strain and Buffer Layer on Interfacial Magnetization in   Sr$_2$CrReO$_6$ Films Determined by Polarized Neutron Reflectometry
  We have determined the depth-resolved magnetization structures of a series of highly ordered Sr$_{2}$CrReO$_{6}$ (SCRO) ferrimagnetic epitaxial films via combined studies of x-ray reflectometry, polarized neutron reflectometry and SQUID magnetometry. The SCRO films deposited directly on (LaAlO$_3$)$_{0.3}$(Sr$_2$AlTaO$_6$)$_{0.7}$ or SrTiO$_{3}$ substrates show reduced magnetization of similar width near the interfaces with the substrates, despite having different degrees of strain. When the SCRO film is deposited on a Sr$_{2}$CrNbO$_{6}$ (SCNO) double perovskite buffer layer, the width the interfacial region with reduced magnetization is reduced, agreeing with an improved Cr/Re ordering. However, the relative reduction of the magnetization averaged over the interfacial regions are comparable among the three samples. Interestingly, we found that the magnetization suppression region is wider than the Cr/Re antisite disorder region at the interface between SCRO and SCNO. 
Yaohua Liu, J. M. Lucy, A. Glavic, H. Ambaye, V. Lauter, F. Y. Yang,   and S. G. E. te Velthuis
cond-mat.mtrl-sci