A simple and robust method for characterization of afterpulsing in   single photon detectors
  Single photon detectors are important for a wide range of applications each with their own specific requirements, which makes necessary the precise characterization of detectors. Here, we present a simple and accurate methodology of characterizing dark count rate, detection efficiency, and after-pulsing in single photon detectors purely based on their counting statistics. We demonstrate our new method on a custom-made, free-running single photon detector based on an InGaAs based avalanche photo diode (APD), though the methodology presented here is applicable for any type of single photon detector. 
Gerhard Humer, Momtchil Peev, Christoph Schaeff, Sven Ramelow, Mario   Stip\v{c}evi\'c, Rupert Ursin
quant-ph