A simple and robust method to study after-pulses in Silicon   Photomultipliers
  The after-pulsing probability in Silicon Photomulti- pliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C. 
Massimo Caccia, Romualdo Santoro and Giovanni Andrea Stanizzi
physics.ins-det