Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten   Transition-Edge Sensors
  We report new experimental studies to understand the physics of phonon sensors which utilize quasiparticle diffusion in thin aluminum films into tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. 
J.J. Yen, B. Shank, B.A. Young, B. Cabrera, P.L. Brink, M. Cherry, J.M   Kreikebaum, R. Moffatt, P. Redl, A. Tomada, E.C. To...
physics.ins-det