Current-voltage characteristics of the two-dimensional XY model with   Monte Carlo dynamics
  Current-voltage characteristics and the linear resistance of the two-dimensional XY model with and without external uniform current driving are studied by Monte Carlo simulations. We apply the standard finite-size scaling analysis to get the dynamic critical exponent $z$ at various temperatures. From the comparison with the resistively-shunted junction dynamics, it is concluded that $z$ is universal in the sense that it does not depend on details of dynamics. This comparison also leads to the quantification of the time in the Monte Carlo dynamic simulation. 
Beom Jun Kim (Umea University)