A comprehensive range of X-ray ionized reflection models
  X-ray ionized reflection occurs when a surface is irradiated with X-rays so intense that its ionization state is determined by the ionization parameter xi propto F/n, where F is the incident flux and n the gas density. It occurs in accretion, onto compact objects including black holes in both active galaxies and stellar-mass binaries, and possibly in gamma-ray bursts. Computation of model reflection spectra is often time-consuming. Here we present the results from a comprehensive grid of models computed with our code, which has now been extended to include what we consider to be all energetically-important ionization states and transitions. This grid is being made available as an ionized-reflection model, REFLION, for XSPEC. 
R.R. Ross (1) and A.C. Fabian (2) ((1) College of the Holy Cross USA,   (2) Institute of Astronomy UK)