Electron diffraction analysis of individual single-walled carbon   nanotubes
  We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects. 
Jannik C. Meyer, Matthieu Paillet, Georg S. Duesberg, Siegmar Roth