Pulse shape analysis in segmented detectors as a technique for   background reduction in Ge double-beta decay experiments
  The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits. 
S. R. Elliott, V. M. Gehman, K. Kazkaz, D-M. Mei, and A. R. Young