Critical indices of random planar electrical networks
  We propose a new method to estimate the critical index $t$ for strength of networks of random fused conductors. It relies on a recently introduced expression for their yield strength. We confirm the results using finite size scaling. To pursue this commitment, we systematically study different damage modalities of conducting networks inducing variations on the behavior of their nonlinear strength reduction. 
J.S. Espinoza Ortiz and Gemunu H. Gunaratne