Pulsed Laser Deposition of a PBN:65 Morphotropic Phase Boundary Thin   Film with Large Electrostriction
  We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB)   Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 um2/V2, and it is consistent with what we measured in the reflection experiment. 
Xi Yang, A.W.Beckwith