Low frequency conductance fluctuations (1/f^\alpha noise) in 15nm Ag   nanowires: Implication on its stability
  We have measured the low frequency (1mHz<f<10Hz) resistance fluctuations in metallic nanowires (diameter 15nm to 200nm) in the temperature range 77K to 400K. The nanowires were grown electrochemically in polycarbonate membranes and the measurements were carried out in arrays of nanowires by retaining them in the membrane. A large fluctuation in excess of conventional 1/f noise which peaks beyond a certain temperature was found. The fluctuations with a significant low frequency component (~1/f^{3/2}) arise when the diameter of the wire ~15nm and vanishes rapidly as the diameter is increased. We argue that Rayleigh-Plateau instability is the likely cause of this excess noise. 
Aveek Bid, Achyut Bora and A. K. Raychaudhuri, D. Chakravortya