Nearly strain-free heteroepitaxial system for fundamental studies of   pulsed laser deposition: EuTiO3 on SrTiO3
  High quality epitaxial thin-films of EuTiO3 have been grown on the (001) surface of SrTiO3 using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two-dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail using ex situ x-ray diffraction. The thicnkess and composition were confirmed with Rutherford Backscattering. The EuTiO3 films grow two-dimensionally, epitaxially, pseudomorphically, with no measurable in-plane lattice mismatch. 
Huan-Hua Wang, Aaron Fleet, Darren Dale, Yuri Suzuki, and J. D. Brock