New spectral classification technique for X-ray sources: quantile   analysis
  We present a new technique called "quantile analysis" to classify spectral properties of X-ray sources with limited statistics. The quantile analysis is superior to the conventional approaches such as X-ray hardness ratio or X-ray color analysis to study relatively faint sources or to investigate a certain phase or state of a source in detail, where poor statistics does not allow spectral fitting using a model. Instead of working with predetermined energy bands, we determine the energy values that divide the detected photons into predetermined fractions of the total counts such as median (50%), tercile (33% & 67%), and quartile (25% & 75%). We use these quantiles as an indicator of the X-ray hardness or color of the source. We show that the median is an improved substitute for the conventional X-ray hardness ratio. The median and other quantiles form a phase space, similar to the conventional X-ray color-color diagrams. The quantile-based phase space is more evenly sensitive over various spectral shapes than the conventional color-color diagrams, and it is naturally arranged to properly represent the statistical similarity of various spectral shapes. We demonstrate the new technique in the 0.3-8 keV energy range using Chandra ACIS-S detector response function and a typical aperture photometry involving background subtraction. The technique can be applied in any energy band, provided the energy distribution of photons can be obtained. 
Jaesub Hong, Eric M. Schlegel and Jonathan E. Grindlay   (Harvard-Smithsonian Center for Astrophysics)