Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of   Si:Theoretical Analysis
  We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the $K$ edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma {\it et al}. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra. 
Yunori Nisikawa, Manabu Usuda, and Jun-ichi Igarashi