Imaging and characterization of conducting ferroelectric domain walls by   photoemission electron microscopy
  High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics. 
J. Schaab, I. P. Krug, F. Nickel, D. M. Gottlob, H. Do\u{g}anay, A.   Cano, M. Hentschel, Z. Yan, E. Bourret, C. M. Schneide...
cond-mat.mtrl-sci