The simulation of loss of U ions due to charge changing processes in the   CSRm ring
  Significant beam loss caused by the charge exchange processes and ions impact induced outgassing play a crucial role in the limitation of the maximum number of accumulated heavy ions during the high intensity operation in the accelerators. With the aim to control beam loss due to charge exchange processes and to confine the generated desorption gas, the tracking of the loss positions and installing the absorber blocks with low-desorption rate material at appropriate locations in the CSRm ring will be taken. The loss simulation of U ions having lost an electron will be presented in this report and the calculation of the collimation efficiency of the CSRm ring will be continued in the future. 
Wenheng Zheng, Jiancheng Yang, Peng Li, Zhongshan Li, Peng Shang,   Guofeng Qu, Wenwen Ge, Meitang Tang, Xiaoping Sha
physics.acc-ph