On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to   Ionizing Radiations
  Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported. 
Fatima Zahra Tazi, Claude Thibeault, Yvon Savaria, Simon Pichette,   Yves Audet
physics.space-ph cs.AR physics.pop-ph