X-Band deflecting cavity design for ultra-short bunch length measurement   of SXFEL at SINAP
  For the development of the X-ray Free Electron Lasers test facility (SXFEL) at SINAP, ultra-short bunch is the crucial requirement for excellent lasing performance. It's a big challenge for deflecting cavity to measure the length of ultra-short bunch, and higher deflecting gradient is required for higher measurement resolution. X-band travelling wave deflecting structure has features of higher deflecting voltage and compact structure, which is good performance at ultra-short bunch length measurement. In this paper, a new X-band deflecting structure has been designed operated at HEM11-2pi/3 mode. For suppressing the polarization of deflecting plane of the HEM11 mode, two symmetrical caves are added on the cavity wall to separate two polarized modes. More details of design and simulation results are presented in this paper. 
Jian-Hao Tan, Qiang Gu, Wen-Cheng Fang, De-Chun Tong, Zhen-Tang Zhao
physics.acc-ph hep-ex