Spectroellipsometric and ion beam analytical studies on a glazed ceramic   object with metallic lustre decoration
  In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements. 
T. Lohner, E. Ag\'ocs, P. Petrik, Z. Zolnai, E. Szil\'agyi, I.   Kov\'acs, Z. Sz\H{o}kefalvi-Nagy, L. T\'oth, A.L. T\'oth, L...
cond-mat.mtrl-sci