Afterpulsing studies of low noise InGaAs/InP single-photon negative   feedback avalanche diodes
  We characterize the temporal evolution of the afterpulse probability in a free-running negative feedback avalanche diode (NFAD) over an extended range, from $\sim$300 ns to $\sim$1 ms. This is possible thanks to an extremely low dark count rate on the order of 1 cps at 10% efficiency, achieved by operating the NFAD at a temperatures as low as 143 K. Experimental results in a large range of operating temperatures (223-143 K) are compared with a legacy afterpulsing model based on multiple trap families at discrete energy levels, which is found to be lacking in physical completeness. Subsequently, we expand on a recent proposal which considers a continuous spectrum of traps by introducing well defined edges to the spectrum, which are experimentally observed. 
Boris Korzh and Tommaso Lunghi and Kateryna Kuzmenko and Gianluca Boso   and Hugo Zbinden
physics.ins-det