Grain structure dependence of coercivity in thin films
  We investigated coercive fields of 200nm x 1200nm x 5nm rectangular nanocrystalline thin films as a function of grain size D using finite elements simulations. To this end, we created granular finite element models with grain sizes ranging from 5nm to 60nm, and performed micromagnetic hysteresis calculations along the y-axis (easy direction) as well as along the x-axis (hard direction). We then used an extended Random Anisotropy model to interpret the results and to illustrate the interplay of random anisotropy and shape induced anisotropy, which is coherent on a much larger scale, in thin films. 
Anton Bachleitner-Hofmann, Bernhard Bergmair, Thomas Schrefl, Armin   Satz, Dieter Suess
physics.comp-ph cond-mat.mes-hall