Fourier-transform Ghost Imaging with Hard X-rays
  Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by X-ray crystallography, however, it is only applied to crystalline structures. Imaging techniques based on X-ray coherent diffraction or zone plates are capable of resolving the internal structure of non-crystalline materials at nanoscales, but it is still a challenge to achieve atomic resolution. Here we demonstrate a novel lensless Fourier-transform ghost imaging method with pseudo-thermal hard X-rays by measuring the second-order intensity correlation function of the light. We show that high resolution Fourier-transform diffraction pattern of a complex amplitude sample can be achieved at Fresnel region and the amplitude and phase distributions of a sample in spatial domain can be retrieved successfully. The method of lensless X-ray Fourier-transform ghost imaging extends X-ray crystallography to non-crystalline samples, and its spatial resolution is limited only by the wavelength of the X-ray, thus atomic resolution should be routinely obtainable. Since highly coherent X-ray source is not required, comparing to conventional X-ray coherent diffraction imaging, the method can be implemented with laboratory X-ray sources, and it also provides a potential solution for lensless diffraction imaging with fermions, such as neutron and electron where the intensive coherent source usually is not available. 
Hong Yu, Ronghua Lu, Shensheng Han, Honglan Xie, Guohao Du, Tiqiao   Xiao, Daming Zhu
physics.optics