Diffractive triangulation of radiative point sources
  We describe a general method to determine the location of a point source of waves relative to a two-dimensional active pixel detector. Based on the inherent structural sensitivity of crystalline sensor materials, characteristic detector diffraction patterns can be used to triangulate the location of a wave emitter. As a practical application of the wide-ranging principle, a digital hybrid pixel detector is used to localize a source of electrons for Kikuchi diffraction pattern measurements in the scanning electron microscope. This provides a method to calibrate Kikuchi diffraction patterns for accurate measurements of microstructural crystal orientations, strains, and phase distributions. 
Stefano Vespucci, Carol Trager-Cowan, Dzmitry Maneuski, Val O'Shea,   Aimo Winkelmann
physics.ins-det cond-mat.mtrl-sci