A gapless micro-dielectric-barrier-discharge ion source for analytical   applications
  Use of dielectric barrier discharge (DBD) as an ion source for sensitive chemical analysis is uncommon because barrier discharges generate excess noise due to spatial and temporal instability. This design uses contacted, crossed glass-coated micro-wires to focus the field into a gradually vanishing gap, suppressing spatial and temporal variability, reducing pressure, temperature, and humidity effects, stabilizing discharge initiation and limiting chemical fragmentation. Positive-ion-mode proton transfer, chemical fragmentation from a micro-discharge, and NO+ adducts combine to allow broad chemical sensitivity. We analyze noise properties of the ion source and report chemical responsivity for a wide range of volatile organic compounds. Source noise spectral density is compared for three systems: the contacted coated wires source, a gapped dielectric barrier discharge source, and a 5 mCi Ni-63 radioactive source. The crossed-wires source shows noise properties approaching those of the white-noise Ni-63 source, while gapped discharge exhibits 1/f noise from area-discharge random path and intensity variations. For chemical sensitivity testing, dilute samples are delivered by vapor flow injection or by gas chromatography, and then detected by differential ion mobility spectrometry (DMS / FAIMS) and, in a few cases by mass spectrometry. The compounds tested in positive ion mode include ketones and alcohols, simple aromatics (benzene, toluene, xylenes, ethyl and propyl benzene), chlorinated and nitrated solvents and aliphatics (hexanes and n-octane), with sensitivities from ppt to ppb levels. The wires source for trace vapor detection is stable under a range of environmental conditions from very low (ppb) humidity levels upward, has wider chemical coverage than the radioactive nickel source with nearly equivalent noise properties, and is adjustable to higher intensity. 
Stephen L. Coy, Evgeny V. Krylov, Gary A. Eiceman, Isik Kanik
physics.ins-det