Suppression of magnetoresistance in thin $WTe_2$ flakes by surface   oxidation
  Recent renewed interest in layered transition metal dichalcogenides stems from the exotic electronic phases predicted and observed in the single- and few-layer limit. Realizing these electronic phases requires preserving the desired transport properties down to a monolayer, which is challenging. Here, using semimetallic $WTe_2$ that exhibits large magnetoresistance, we show that surface oxidation and Fermi level pinning degrade the transport properties of thin $WTe_2$ flakes significantly. With decreasing $WTe_2$ flake thickness, we observe a dramatic suppression of the large magnetoresistance. This is explained by fitting a two-band model to the transport data, which shows that mobility of the electron and hole carriers decreases significantly for thin flakes. The microscopic origin of this mobility decrease is attributed to a ~ 2 nm-thick amorphous surface oxide layer that introduces disorder. The oxide layer also shifts the Fermi level by ~ 300 meV at the $WTe_2$ surface. However, band bending due to this Fermi level shift is not the dominant cause for the suppression of magnetoresistance as the electron and hole carrier densities are balanced down to ~ 13 nm based on the two-band model. Our study highlights the critical need to investigate often unanticipated and sometimes unavoidable extrinsic surface effects on the transport properties of layered dichalcogenides and other 2D materials. 
J. M. Woods, J. Shen, P. Kumaravadivel, Y. Pang, Y. Xie, G. A. Pan, M.   Li, E. I. Altman, L. Lu, J. J. Cha
cond-mat.mtrl-sci