Distribution of current fluctuations in a bistable conductor
  We measure the full distribution of current fluctuations in a single-electron transistor with a controllable bistability. The conductance switches randomly between two levels due to the tunneling of single electrons in a separate single-electron box. The electrical fluctuations are detected over a wide range of time scales and excellent agreement with theoretical predictions is found. For long integration times, the distribution of the time-averaged current obeys the large-deviation principle. We formulate and verify a fluctuation relation for the bistable region of the current distribution. 
S. Singh, J. T. Peltonen, I. M. Khaymovich, J. V. Koski, C. Flindt, J.   P. Pekola
cond-mat.mes-hall