Thermal x-ray diffraction and near-field phase contrast imaging
  Using higher-order coherence of thermal light sources, the resolution power of standard x-ray imaging techniques can be enhanced. In this work, we applied the higher-order measurement to far-field x-ray diffraction and near-field phase contrast imaging (PCI), in order to achieve superresolution in x-ray diffraction and obtain enhanced intensity contrast in PCI. The cost of implementing such schemes is minimal compared to the methods that achieve similar effects by using entangled x-ray photon pairs. 
Zheng Li, Anton Classen, Tao Peng, Nikita Medvedev, Fenglin Wang,   Henry N. Chapman, Yanhua Shih
physics.optics quant-ph