Bragg projection ptychography on niobium phase domain
  We demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg "dark field" imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analysed with the help of a careful combination of implemented refinement mechanisms. 
Nicolas Burdet, Xiaowen Shi, Jesse N. Clark, Xiaojing Huang, Ross   Harder and I.K. Robinson
cond-mat.mtrl-sci cond-mat.mes-hall