Focal shift of silicon microlens in mid-infrared regime
  In this study, rigorous numerical calculation was utilized to characterize the focal properties of mid-infrared silicon microlens with the size about tens of micrometers. It is found that the focal shift phenomenon also exists in mid-infrared regime, which behaves differently from that of visual and near-infrared wavelength. Focal properties of silicon microlens were also measured experimentally, showing well coherence with simulation results. Our results provide systemic understanding of focal shift in mid-infrared regime, at that wavelength special consideration should be paid in micro-nano optics, especially with the integration between infrared optical system and other devices. 
Haijie Zuo, Jiangyong Zhang, Leiying Ying, Baoping Zhang, Zhijin Hou,   Hongxu Chen, Junjie Si
physics.optics