Flaw Inspection in Nonferrous Conductors Using Magneto-OpticDetection Methods
{'Code': '07010000', 'Directorate': {'LongName': 'Directorate For Engineering'}, 'Division': {'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Michelle Dunn'}
A novel method is developed for visualization of sub-surface flaws in nonferrous conductors by the use of magneto-optic materials.
[{'FirstName': 'Thomas', 'LastName': 'Davis', 'EmailAddress': None, 'StartDate': '05/01/1985', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}, {'FirstName': 'R.', 'LastName': 'Silta', 'EmailAddress': None, 'StartDate': '05/01/1985', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}, {'FirstName': 'Gerald', 'LastName': 'Fitzpatrick', 'EmailAddress': 'physres@earthlink.net', 'StartDate': '05/01/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}, {'FirstName': 'B.', 'LastName': 'Hildebrand', 'EmailAddress': None, 'StartDate': '05/01/1985', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}]
{'Name': 'Sigma Research Inc', 'CityName': 'Redmond', 'ZipCode': '980523482', 'PhoneNumber': '2068811807', 'StreetAddress': '8710 148th Avenue NE', 'CountryName': 'United States', 'StateName': 'Washington', 'StateCode': 'WA'}
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