Easily Manufacturable Implementation of Large Area Defect   Tolerant IC's
{'Code': '05010600', 'Directorate': {'Abbreviation': 'CSE', 'LongName': 'Direct For Computer & Info Scie & Enginr'}, 'Division': {'Abbreviation': 'CCF', 'LongName': 'Division of Computing and Communication Foundations'}}
{'SignBlockName': 'Murali R. Varanasi', 'PO_EMAI': None, 'PO_PHON': None}
This project is developing techniques for fabricating large-area                integrated circuits (IC) on standard IC fabrication lines.  The                 circuits under consideration are 10 to 50 times the area of current             circuits.  The researchers are characterizing manufacturing defects on          integrated circuits, and analyzing these to predict chip yields.  From          these predictions they can select among various techniques for on-chip          reconfiguration for defect tolerance.
{'FirstName': 'Wojciech', 'LastName': 'Maly', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Wojciech Maly', 'EmailAddress': 'maly@ece.cmu.edu', 'NSF_ID': '000209812', 'StartDate': '07/01/1989', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Carnegie-Mellon University', 'CityName': 'PITTSBURGH', 'ZipCode': '152133815', 'PhoneNumber': '4122688746', 'StreetAddress': '5000 FORBES AVE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Pennsylvania', 'StateCode': 'PA', 'CONGRESSDISTRICT': '18', 'CONGRESS_DISTRICT_ORG': 'PA18', 'ORG_UEI_NUM': 'U3NKNFLNQ613', 'ORG_LGL_BUS_NAME': 'CARNEGIE MELLON UNIVERSITY', 'ORG_PRNT_UEI_NUM': 'U3NKNFLNQ613'}
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{'Code': '4710', 'Text': 'DES AUTO FOR MICRO & NANO SYS'}
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