Uniaxial Stress Dependent Studies Related to III-V          Semiconductor Devices
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Brian J. Clifton', 'PO_EMAI': None, 'PO_PHON': None}
Electrical measurements as a function of applied uniaxial stress will           be made on GaAs/A1GaAs structures.  Three areas will be covered:                                                                                                1)  Tunneling measurements.  Fowler-Nordheim tunneling, single barrier          direct tunneling and double barrier resonant tunneling will be studied          to determine the position in crystal momentum space of the electronic           states in the barrier which govern the tunneling processes.                                                                                                     2)  DX centers.  Kinetic trapping and transport measurements will be            made to determine the position in crystal momentum space of the DX              center and associated energy bands.                                                                                                                             3)  Pseudomorphic structures.  Transport measurements will be made on           lattice matched systems to simulate pseudomorphic structures to                 elucidate and optimize these properties.
{'FirstName': 'Marshall', 'LastName': 'Nathan', 'PI_MID_INIT': 'I', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Marshall I Nathan', 'EmailAddress': 'nathan@ee.umn.edu', 'NSF_ID': '000194562', 'StartDate': '11/01/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'University of Minnesota-Twin Cities', 'CityName': 'MINNEAPOLIS', 'ZipCode': '554552009', 'PhoneNumber': '6126245599', 'StreetAddress': '200 OAK ST SE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Minnesota', 'StateCode': 'MN', 'CONGRESSDISTRICT': '05', 'CONGRESS_DISTRICT_ORG': 'MN05', 'ORG_UEI_NUM': 'KABJZBBJ4B54', 'ORG_LGL_BUS_NAME': 'REGENTS OF THE UNIVERSITY OF MINNESOTA', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '1456', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
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