Expedited Award:  Electron Transport Mechanisms in Compound Semiconductor Devices by SEM Measurements
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Cassandra Queen', 'PO_EMAI': 'cqueen@nsf.gov', 'PO_PHON': '7032925383'}
Semiconductor Field Effect Transistors and GaAs/AlGaAs Heterojunction           Field Effect Transistors have demonstrated performance suitable for             operation in systems at millimeter wave frequencies, and in ultra-high          speed integrated circuits.  While a large body of work modeling these           devices exists, the only experimental results are S-parameter device            measurements and the device performance in circuits.  Thus, the                 detailed physics of these devices are surmised from their circuit               performance and the correlation of trends predicted by modeling.                Measurement of parameters affecting the physics of these devices are            virtually nonexistent.  This proposal will attempt to measure some              fundamental device parameters using an electron beam probe.  Previous,          work of this kind on semiconductor devices, have been largely confined          to Gunn devices, and GaAs FETs.  Other work in this area has been               performed by using the gate current of a GaAs FET as a measurement              probe for the electron temperature in the channel.
[{'FirstName': 'Anand', 'LastName': 'Gopinath', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Anand Gopinath', 'EmailAddress': 'gopinath@umn.edu', 'NSF_ID': '000100975', 'StartDate': '04/15/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}, {'FirstName': 'Michael', 'LastName': 'Shur', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Michael Shur', 'EmailAddress': 'shurm@rpi.edu', 'NSF_ID': '000324987', 'StartDate': '04/15/1988', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}]
{'Name': 'University of Minnesota-Twin Cities', 'CityName': 'MINNEAPOLIS', 'ZipCode': '554552009', 'PhoneNumber': '6126245599', 'StreetAddress': '200 OAK ST SE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Minnesota', 'StateCode': 'MN', 'CONGRESSDISTRICT': '05', 'CONGRESS_DISTRICT_ORG': 'MN05', 'ORG_UEI_NUM': 'KABJZBBJ4B54', 'ORG_LGL_BUS_NAME': 'REGENTS OF THE UNIVERSITY OF MINNESOTA', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '145600', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8812837.xml'}