Presidential Young Investigator Award
{'Code': '03070004', 'Directorate': {'Abbreviation': 'MPS', 'LongName': 'Direct For Mathematical & Physical Scien'}, 'Division': {'Abbreviation': 'DMR', 'LongName': 'Division Of Materials Research'}}
{'SignBlockName': 'LaVerne D. Hess', 'PO_EMAI': None, 'PO_PHON': None}
A scanning tunneling miscrocope facility will be developed with                 the emphasis on a versatile instrument design which can be                      utilized in a variety of applications.  In the first year of this               project instrument design, construction and automation will be                  emphasized.  The instrument will be constructed so as to operate                in air or vacuum, to assure versatility of application.  The                    initial application to be studied is surface profilometry of                    precision machined surfaces.                                                                                                                                    Concurrently with the STM development, a focused ion beam system                utilizing a liquid-metal source of submicron spot size will be                  developed.  Applications of this system to materials analysis and               modification include: 1) scanning ion microscopy utilizing                      secondary electrons generated by the focused ion beam; 2) ion                   beam micromachining of surfaces; 3) localized ion implantation                  for semiconductor device fabrication and 4) fundamentals of                     focused ion beam/specimen interactions for the energy range 1-25                keV will be investigated.                                                                                                                                       A long term objective of this program (beyond the first year)                   will be to combine the Focused Ion Beam System with an in-situ                  STM for beam surface interaction studies.                                                                                                                       This is a Presidential Young Investigator Award for 1987.
{'FirstName': 'Phillip', 'LastName': 'Russell', 'PI_MID_INIT': 'E', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Phillip E Russell', 'EmailAddress': 'prussell@ncsu.edu', 'NSF_ID': '000255145', 'StartDate': '07/01/1987', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'North Carolina State University', 'CityName': 'RALEIGH', 'ZipCode': '276950001', 'PhoneNumber': '9195152444', 'StreetAddress': '2601 WOLF VILLAGE WAY', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'North Carolina', 'StateCode': 'NC', 'CONGRESSDISTRICT': '02', 'CONGRESS_DISTRICT_ORG': 'NC02', 'ORG_UEI_NUM': 'U3NVH931QJJ3', 'ORG_LGL_BUS_NAME': 'NORTH CAROLINA STATE UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
[{'Code': '1772', 'Text': 'CERAMICS & ELECTRONIC MATERIAL'}, {'Code': '1775', 'Text': 'ELECTRONIC/PHOTONIC MATERIALS'}]
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1986&All=true', 'xml': '8657813.xml'}