In-Situ Capacitance Sensor for Langmuir/Blodgett Deposition
{'Code': '07020000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'CBET', 'LongName': 'Div Of Chem, Bioeng, Env, & Transp Sys'}}
{'SignBlockName': 'Robert M. Wellek', 'PO_EMAI': None, 'PO_PHON': None}
The opportunity to create design and manufacturing protocols for the            creation of engineered polymeric ultrathin film systems (PUFS) may              rest to a great degree on the development of sophisticated, in-situ             diagnostics.  The Langmuir/Blodgett (L/B) deposition technique offers           the possibility of providing the foundation for the application of              organics to important emerging fields, such as optics, electronics,             and biotechnology.  These applications depend on precise control of             materials properties such as positional and orientational order of              active molecular structures, alternation of layers, and thickness.              For L/B deposition, surface pressure and Langmuir-layer area have               remained the only necessary diagnostic techniques because L/B methods           were confined to simple organics.                                                                                                                               The investigators have shown that it is possible to detect the                  thickness of a single L/B monolayer using a capacitance sensor                  composed of interdigitated metal electrodes.  The sensor is fabricated          on the substrate that is to be coated with the L/B film.  It is                 proposed to extend this work to examine other promising applications            of the capacitance sensor.                                                                                                                                      It has been necessary to redesign the sensor to eliminate or minimize           subphase entrainment by the sensor itself.  This was achieved by                coating the sensor with a hydrophobic monolayer and designing the               sensor so that the electrodes are normal to the interface during                dipping.  The sensor also allows the study of the role of film drying           on deposition quality.  In addition to quantifying subphase                     incorporation, the sensor is used to study how L/B films coat over              complex topography.
[{'FirstName': 'Pieter', 'LastName': 'Stroeve', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Pieter Stroeve', 'EmailAddress': 'pstroeve@ucdavis.edu', 'NSF_ID': '000440634', 'StartDate': '09/01/1987', 'EndDate': None, 'RoleCode': 'Principal Investigator'}, {'FirstName': 'Brian', 'LastName': 'Higgins', 'PI_MID_INIT': 'G', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Brian G Higgins', 'EmailAddress': 'bghiggins@ucdavis.edu', 'NSF_ID': '000385594', 'StartDate': '09/01/1987', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}, {'FirstName': 'Stephen', 'LastName': 'Kowel', 'PI_MID_INIT': 'T', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Stephen T Kowel', 'EmailAddress': 'stephen.kowel@uc.edu', 'NSF_ID': '000225302', 'StartDate': '09/01/1987', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}]
{'Name': 'University of California-Davis', 'CityName': 'DAVIS', 'ZipCode': '956186153', 'PhoneNumber': '5307547700', 'StreetAddress': '1850 RESEARCH PARK DR STE 300', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'California', 'StateCode': 'CA', 'CONGRESSDISTRICT': '04', 'CONGRESS_DISTRICT_ORG': 'CA04', 'ORG_UEI_NUM': 'TX2DAGQPENZ5', 'ORG_LGL_BUS_NAME': 'UNIVERSITY OF CALIFORNIA, DAVIS', 'ORG_PRNT_UEI_NUM': 'NUDGYLBB4S99'}
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{'Code': '1414', 'Text': 'INTERFAC PROCESSES & THERMODYN'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1987&All=true', 'xml': '8716623.xml'}