Charge Transport and Storage in Multi-Insulator             Microstructures
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Cassandra Queen', 'PO_EMAI': 'cqueen@nsf.gov', 'PO_PHON': '7032925383'}
This research is concerned with fundamental device physical electronics         to understand the basic limitations of solid-state microstructures              which rely on quantum mechanical tunneling of carriers into deep                storage traps.  These traps provide the basis for non-volatile memory           structures in a new multi-insulator device structure--the                       Metal-blocking oxide-nitride-tunneling oxide-silicon (MONOS)                    microstructure.  This research explores the physical mechanisms through         which charge injection, transport, and storage is achieved in these             devices.  The experimental approach focuses on "scaled" microstructures         to understand the fundamental mechanisms which determine the                    erase/write, retention, and endurance properties of these devices.  An          objective of this research is to develop an analytical model of the             MONOS operation in terms of the nature and distribution of traps within         the nitride storage layer.  The research also seeks to explore the              origin and control of these traps through a model of the process                technology for multi-insulator film preparation.  The results of this           research impact the design of high density, non-volatile, silicon               microstructures for high-speed, long retention, memories with greatly           improved endurance to cycling.
{'FirstName': 'Marvin', 'LastName': 'White', 'PI_MID_INIT': 'H', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Marvin H White', 'EmailAddress': 'white@ece.osu.edu', 'NSF_ID': '000326395', 'StartDate': '07/01/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Lehigh University', 'CityName': 'BETHLEHEM', 'ZipCode': '180153008', 'PhoneNumber': '6107583021', 'StreetAddress': '526 BRODHEAD AVE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Pennsylvania', 'StateCode': 'PA', 'CONGRESSDISTRICT': '07', 'CONGRESS_DISTRICT_ORG': 'PA07', 'ORG_UEI_NUM': 'E13MDBKHLDB5', 'ORG_LGL_BUS_NAME': 'LEHIGH UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
[{'Code': '145600', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}, {'Code': '914500', 'Text': 'SPECIAL PROGRAMS-RESERVE'}]
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1985&All=true', 'xml': '8506575.xml'}