Dynamics and Structural Order of Noncrystalline             Semiconductors
{'Code': '03070003', 'Directorate': {'Abbreviation': 'MPS', 'LongName': 'Direct For Mathematical & Physical Scien'}, 'Division': {'Abbreviation': 'DMR', 'LongName': 'Division Of Materials Research'}}
{'SignBlockName': 'H. Hollis Wickman', 'PO_EMAI': None, 'PO_PHON': None}
The study of thin film amorphous solids by Raman scattering will                be employed to provide basic information on the dynamics and                    structural order of noncrystalline semiconductors.  Raman studies               will be utilized in thin and ultrathin film geometries.  This                   includes "modified geometries" such as interfaces, voids,                       ultrasmall microcrystals and in ultrathin film island                           configurations.  Information about the effects of these special                 geometries on the vibrational Raman spectra are studied.  These                 experiments utilize Raman scattering enhancement methods to allow               weak signal levels associated with such configurations to be                    explored.  The growth of ultrathin film amorphous solids will be                monitored by Auger electron spectroscopy and selected scanning                  transmission electron microscopy measurements.  Raman scattering                measurements will additionally be employed in thin film dilute                  alloys with tetrahedrally coordinated systems of amorphous                      semiconductors amorphous germanium and amorphous silicon to                     obtain information about structural modifications in the                        nonmetal-metal transition.  Complementing these Raman studies                   will be optical adsorption and spectroscopic ellipsometry                       measurements of changes in the electronic states.
{'FirstName': 'Jeffrey', 'LastName': 'Lannin', 'PI_MID_INIT': 'S', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Jeffrey S Lannin', 'EmailAddress': 'jsl@phys.psu.edu', 'NSF_ID': '000302906', 'StartDate': '06/01/1987', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Pennsylvania State Univ University Park', 'CityName': 'UNIVERSITY PARK', 'ZipCode': '168021503', 'PhoneNumber': '8148651372', 'StreetAddress': '201 OLD MAIN', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Pennsylvania', 'StateCode': 'PA', 'CONGRESSDISTRICT': '15', 'CONGRESS_DISTRICT_ORG': 'PA15', 'ORG_UEI_NUM': 'NPM2J7MSCF61', 'ORG_LGL_BUS_NAME': 'THE PENNSYLVANIA STATE UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
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[{'Code': '1761', 'Text': 'SOLID STATE PHYSICS'}, {'Code': '1772', 'Text': 'CERAMICS & ELECTRONIC MATERIAL'}]
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