Database Support for Computer Integrated Manufacturing
{'Code': '05010600', 'Directorate': {'Abbreviation': 'CSE', 'LongName': 'Direct For Computer & Info Scie & Enginr'}, 'Division': {'Abbreviation': 'CCF', 'LongName': 'Division of Computing and Communication Foundations'}}
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The project aims to increase competitiveness in the semiconductor               industry through improved methods of computer-integrated manufacturing          techniques for microelectronic fabrication.  In particular, the work            will develop systems that integrate all data on product and process             design, equipment, process and facility control, quality assurance and          testing, and production scheduling.  The data base will contain process         recipes, listings of work in process, and physical and electrical test          results.  As far as possible, the different versions or "views" of the          data for a single process should be created on demand from this single          database representation.                                                                                                                                        Continuing real-world testing will be a major part of this research.            The test bed will be the University of California-Berkeley's Microlab.          Database management systems and programming aids for manufacturing now          under development at Berkeley and sponsored by various organizations            will be utilized.                                                                                                                                               Initially, four specific application areas will be investigated:                facility management, tracking of work in progress, automatic                    inspection, and the application of Berkeley's expert system to low-             pressure chemical-vapor deposition.                                             The significance of this project lies in the boost to productivity and          product quality that successful completion will bring.  Beyond the              immediate payoff in semiconductor wafer fabrication, the work is likely         to lead to valuable insights into the basic nature of production                organization and control that will be applicable to other manufacturing         operations as well.  The researchers involved can be counted on to take         a broad point of view and their graduate students will be a valuable            resource in bringing sophisticated tools and methods to the                     manufacturing environment.
[{'FirstName': 'David', 'LastName': 'Hodges', 'PI_MID_INIT': 'A', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'David A Hodges', 'EmailAddress': None, 'NSF_ID': '000157349', 'StartDate': '09/01/1987', 'EndDate': None, 'RoleCode': 'Principal Investigator'}, {'FirstName': 'Lawrence', 'LastName': 'Rowe', 'PI_MID_INIT': 'A', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Lawrence A Rowe', 'EmailAddress': 'larry@cs.berkeley.edu', 'NSF_ID': '000246592', 'StartDate': '09/01/1987', 'EndDate': None, 'RoleCode': 'Co-Principal Investigator'}]
{'Name': 'University of California-Berkeley', 'CityName': 'BERKELEY', 'ZipCode': '947101749', 'PhoneNumber': '5106433891', 'StreetAddress': '1608 4TH ST STE 201', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'California', 'StateCode': 'CA', 'CONGRESSDISTRICT': '12', 'CONGRESS_DISTRICT_ORG': 'CA12', 'ORG_UEI_NUM': 'GS3YEVSS12N6', 'ORG_LGL_BUS_NAME': 'REGENTS OF THE UNIVERSITY OF CALIFORNIA, THE', 'ORG_PRNT_UEI_NUM': None}
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[{'Code': '4710', 'Text': 'DES AUTO FOR MICRO & NANO SYS'}, {'Code': '9120', 'Text': 'CROSS-DIRECTORATE PROGRAMS'}, {'Code': '9145', 'Text': 'SPECIAL PROGRAMS-RESERVE'}]
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1987&All=true', 'xml': '8715557.xml'}