Instrument for Electrical Surface Characterization During   Processing
{'Code': '15030000', 'Directorate': {'Abbreviation': 'TIP', 'LongName': 'Dir for Tech, Innovation, & Partnerships'}, 'Division': {'Abbreviation': 'TI', 'LongName': 'Translational Impacts'}}
{'SignBlockName': 'Ritchie B. Coryell', 'PO_EMAI': None, 'PO_PHON': None}
The research will develop an instrument for monitoring the                 work function of surfaces during surface processing.  The                       instrument measures the contact potential difference between                    the surface and an inert reference electrode by a variable                      capacitance technique.  A novel method for capacitance                          modulation between the unknown and the reference electrode is                   used.  The measurement can be done in vacuum or ambient gas.                    The probe design would allow it to be moved away during sample                  annealing, or over-coating of the sample surface, and then                      repositioned for measurement.  Provision can be made to clean                   or remove sample surface layers in order to expose fresh bulk                   material.                                                                            Specifically, the instrument is designed to monitor                        changes in the surface electrical properties of high critical                   temperature oxide superconductors that are being processed for                  superconducting quantum interference devices (SQUIDS) and                       radio frequency cavity structures.  The instrument is also                      suitable for monitoring semiconductor surfaces during                           processing.
{'FirstName': 'George', 'LastName': 'Webb', 'PI_MID_INIT': 'W', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'George W Webb', 'EmailAddress': 'gwwebb@ucsd.edu', 'PI_PHON': '6194528760', 'NSF_ID': '000452203', 'StartDate': '04/01/1989', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Energy Science Laboratories Inc', 'CityName': 'SAN DIEGO', 'ZipCode': '921212232', 'PhoneNumber': '6195877092', 'StreetAddress': '6888 NANCY RIDGE DR.', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'California', 'StateCode': 'CA', 'CONGRESSDISTRICT': '52', 'CONGRESS_DISTRICT_ORG': 'CA52', 'ORG_UEI_NUM': None, 'ORG_LGL_BUS_NAME': None, 'ORG_PRNT_UEI_NUM': None}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
{'Code': '5371', 'Text': 'SBIR Phase I'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8860687.xml'}