Evaluation of Charge Trapping in Semiconducting Metal Oxide by Deep Level Transient Spectroscopy
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Cassandra Queen', 'PO_EMAI': 'cqueen@nsf.gov', 'PO_PHON': '7032925383'}
Funds are provided for instrumentation for deep level transient                 spectroscopy (DLTS) studies in semiconducting ceramic oxides.  DLTS has         not been studied extensively in ceramic oxides and therefore the                information will be a useful first step in understanding the defect             structure of such oxides.  The equipment will complement a new research         start to study shallow traps in ceramic oxides.  Further, the                   instrumentation will assist Alfred University in developing a                   well-equipped laboratory for electronic ceramics.
{'FirstName': 'James', 'LastName': 'Cordaro', 'PI_MID_INIT': 'F', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'James F Cordaro', 'EmailAddress': 'jcordaro@phy.mtu.edu', 'NSF_ID': '000225889', 'StartDate': '07/01/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Alfred University NY State College of Ceramics', 'CityName': 'ALFRED', 'ZipCode': '148021205', 'PhoneNumber': '6078712964', 'StreetAddress': '1 SAXON DR', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'New York', 'StateCode': 'NY', 'CONGRESSDISTRICT': '23', 'CONGRESS_DISTRICT_ORG': 'NY23', 'ORG_UEI_NUM': 'J1B5PBG573T1', 'ORG_LGL_BUS_NAME': 'ALFRED UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '177200', 'Text': 'CERAMICS & ELECTRONIC MATERIAL'}
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