Physical Electronics of Mult-Dielectric Microstructures
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Arthur R. Bergen'}
The proposed research program is a continuation of studies into the             basic charge transport and storage characteristics in multidielectric           microstructures.  In this proposed program of one year, the PI will             examine the electron and hole components of the tunneling current               which crosses the Si-SiO2 boundary with a unique 'dual-channel' SONOS           microstructure. (polySilicon gate blocking Oxide-Silicon Nitride-               tunnel Oxide-Silicon)
{'FirstName': 'Marvin', 'LastName': 'White', 'EmailAddress': 'white@ece.osu.edu', 'StartDate': '02/01/1989', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Lehigh University', 'CityName': 'Bethlehem', 'ZipCode': '180153005', 'PhoneNumber': '6107583021', 'StreetAddress': 'Alumni Building 27', 'CountryName': 'United States', 'StateName': 'Pennsylvania', 'StateCode': 'PA'}
{'Code': '1456', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8818159.xml'}