IUC: Examination of Hot Carrier Induced FET Degradation in  Gate Dielectrics Incorporating Nitrogen
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Cassandra Queen', 'PO_EMAI': 'cqueen@nsf.gov', 'PO_PHON': '7032925383'}
This project will examine the physics of hot carrier induced                    degradation in an alternative gate dielectric, a silicon oxide-nitride,         currently being widely considered.  N-channel, silicon gate FETs                incorporating various forms of the oxide-nitride gate dielectric would          be fabricated, stressed by hot carrier injection, and the device                parameters evaluated to assess not only the extent of the charge                generation and trapping, but also the nature and characteristics of the         charge generated.  A modified form of substrate hot electron (SHE)              injection will be employed in device stressing, a form permitting               independent control of the oxide and accelerating electric fields as            well as the injection current level.  Current-voltage and                       capacitance-voltage characteristics will be examined to evaluate the            type and quantity of charges generated as well as to evaluate induced           changes in device performance.
{'FirstName': 'Kenneth', 'LastName': 'Roenker', 'PI_MID_INIT': 'P', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Kenneth P Roenker', 'EmailAddress': 'kroenker@ececs.uc.edu', 'NSF_ID': '000342116', 'StartDate': '08/01/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'University of Cincinnati Main Campus', 'CityName': 'CINCINNATI', 'ZipCode': '452202872', 'PhoneNumber': '5135564358', 'StreetAddress': '2600 CLIFTON AVE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Ohio', 'StateCode': 'OH', 'CONGRESSDISTRICT': '01', 'CONGRESS_DISTRICT_ORG': 'OH01', 'ORG_UEI_NUM': 'DZ4YCZ3QSPR5', 'ORG_LGL_BUS_NAME': 'CINCINNATI UNIV OF', 'ORG_PRNT_UEI_NUM': 'DZ4YCZ3QSPR5'}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
{'Code': '145600', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1985&All=true', 'xml': '8511853.xml'}