Implementation of Atom Beam Scattering to Study the Growth  of Ultra Thin Films
{'Code': '03070004', 'Directorate': {'Abbreviation': 'MPS', 'LongName': 'Direct For Mathematical & Physical Scien'}, 'Division': {'Abbreviation': 'DMR', 'LongName': 'Division Of Materials Research'}}
{'SignBlockName': 'LaVerne D. Hess', 'PO_EMAI': None, 'PO_PHON': None}
This is an innovative experimental program of research to study                 fundamental issues in the physics and chemistry of ultra-thin                   films (one or two atomic layers).  This study will implement                    atom beam scattering as a new technique to investigate the                      structure and chemical bonding of the atomic layers to the                      substrate.  Materials being studied include metal films on                      silicon and metals.  Studies include geometry and chemical                      bonding in heteroepitaxy, strained epitaxial films, kinetics of                 film growth, and electronic characterization of films and                       interfaces.  Low energy electron diffraction and helium ion beam                scattering will be used to characterize the structure of the                    films and interfaces.                                                                                                                                           The research is relevant to processing and properties of                        integrated electronic circuits.  Issues such as doping, Schottky                barriers, and metallization will benefit from the research.
{'FirstName': 'Gianfranco', 'LastName': 'Vidali', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Gianfranco Vidali', 'EmailAddress': 'gvidali@mailbox.syr.edu', 'NSF_ID': '000219651', 'StartDate': '12/01/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Syracuse University', 'CityName': 'SYRACUSE', 'ZipCode': '13244', 'PhoneNumber': '3154432807', 'StreetAddress': '900 S CROUSE AVE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'New York', 'StateCode': 'NY', 'CONGRESSDISTRICT': '22', 'CONGRESS_DISTRICT_ORG': 'NY22', 'ORG_UEI_NUM': 'C4BXLBC11LC6', 'ORG_LGL_BUS_NAME': 'SYRACUSE UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
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[{'Code': '177200', 'Text': 'CERAMICS & ELECTRONIC MATERIAL'}, {'Code': '177500', 'Text': 'ELECTRONIC/PHOTONIC MATERIALS'}]
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8802512.xml'}