Research Initiation:  Study of Subthreshold Laser Illuminat-ion Effects in Solids Using Raman Scattering
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'Cassandra Queen', 'PO_EMAI': 'cqueen@nsf.gov', 'PO_PHON': '7032925383'}
Raman scattering will be used to observe and characterize gradual               structural changes in solids during repeated illumination by picosecond         pulses.  By detecting the shift, broadening, and lineshape changes of           the Stokes line with an accuracy of + 0.1 cm-1, the accumulation of             plastic strains and the formation of microcrystallites will be readily          detected.  Other candidates to explain the precursors will also affect          the Stokes line.  These experiments will first be performed in                  disordered and crystalline semiconductors (bulk or thin film), then             extended to other materials, such as those used in optical coatings.            The results will be compared to existing models, and the nature of the          precursors will be established.
{'FirstName': 'Philippe', 'LastName': 'Fauchet', 'PI_MID_INIT': 'M', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Philippe M Fauchet', 'EmailAddress': 'fauchet@ece.rochester.edu', 'NSF_ID': '000468300', 'StartDate': '06/01/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Princeton University', 'CityName': 'PRINCETON', 'ZipCode': '085442001', 'PhoneNumber': '6092583090', 'StreetAddress': '1 NASSAU HALL', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'New Jersey', 'StateCode': 'NJ', 'CONGRESSDISTRICT': '12', 'CONGRESS_DISTRICT_ORG': 'NJ12', 'ORG_UEI_NUM': 'NJ1YPQXQG7U5', 'ORG_LGL_BUS_NAME': 'THE TRUSTEES OF PRINCETON UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '145600', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
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