Time-resolved X-ray Studies of Kinetics of Metastable       Materials
{'Code': '03070003', 'Directorate': {'Abbreviation': 'MPS', 'LongName': 'Direct For Mathematical & Physical Scien'}, 'Division': {'Abbreviation': 'DMR', 'LongName': 'Division Of Materials Research'}}
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The use of materials in metastable states is becoming very                      pervasive in many technological applications.  Very often the                   atomic arrangements in such cases have intermediate-range order                 somewhat characteristic of crystalline structure but they are not               in true thermodynamic equilibrium.  The kinetic behavior of                     metastable structures, and especially their relation to the                     equilibrium long-range ordered state, is quite poorly understood                at present.  There has been substantial progress in the theory of               non-equilibrium processes using the concepts of kinetic critical                phenomena, but little experimental work which probes directly the               microscopic mechanisms.                                                                                                                                         We propose a thorough study of this area utilizing powerful ne                  techniques in time-resolved x-ray diffuse scattering.  The                      research exploits the recent developments in x-ray sources (very                brightness synchrotron radiation) and detectors (fast two-                      dimensional CCDs) which are expected to revolutionize time-                     resolved studies.  The goal of the research is to identify                      universal features of the kinetics which can be incorporated into               a general quantitative description of non-equilibrium structural                processes.  Two model systems have been chosen for these studies;               the research will focus on the rapid thermal annealing of thin-                 film heterostructures which have important optoelectronic                       applications, and the growth and relaxation mechanisms of                       electrochemically deposited dendrites and thin film structures.
{'FirstName': 'Roy', 'LastName': 'Clarke', 'PI_MID_INIT': None, 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Roy Clarke', 'EmailAddress': 'royc@umich.edu', 'NSF_ID': '000301592', 'StartDate': '11/01/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Regents of the University of Michigan - Ann Arbor', 'CityName': 'ANN ARBOR', 'ZipCode': '481091079', 'PhoneNumber': '7347636438', 'StreetAddress': '1109 GEDDES AVE, SUITE 3300', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Michigan', 'StateCode': 'MI', 'CONGRESSDISTRICT': '06', 'CONGRESS_DISTRICT_ORG': 'MI06', 'ORG_UEI_NUM': 'GNJ7BBP73WE9', 'ORG_LGL_BUS_NAME': 'REGENTS OF THE UNIVERSITY OF MICHIGAN', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '1764', 'Text': 'LOW TEMPERATURE PHYSICS'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8805156.xml'}