Engineering Research Equipment Grant for Infrared           Thermographic System
{'Code': '07030000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'CMMI', 'LongName': 'Div Of Civil, Mechanical, & Manufact Inn'}}
{'SignBlockName': 'Dianne McCormick', 'PO_EMAI': None, 'PO_PHON': None}
Current technology often requires an ability to analyze remotely the            behavior of complex materials and components, and in adverse                    environments.  Advanced strain (stress) analysis and quantitative NDE           methods are particularly needed.  Although most conventional approaches         are inadequate, or are unsuitable for hostile environments such as              cryogenic or elevated temperatures, differential thermography (SPATE)           appears advantageous for such applications.  The technique is non-              contacting and sensitive, and provides information expediently which is         difficult or virtually impossible to obtain otherwise.  A SPATE (Stress         Pattern Analysis by Thermal Emission) system primarily for stress               analysis, and NDE of composites and ceramics at extreme temperatures.           Current applications also include thin films, wood, welds, orthopedic           implants and material damage.
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{'Name': 'University of Wisconsin-Madison', 'CityName': 'MADISON', 'ZipCode': '537151218', 'PhoneNumber': '6082623822', 'StreetAddress': '21 North Park Street', 'StreetAddress2': 'Suite 6301', 'CountryName': 'United States', 'StateName': 'Wisconsin', 'StateCode': 'WI', 'CONGRESSDISTRICT': '02', 'CONGRESS_DISTRICT_ORG': 'WI02', 'ORG_DUNS_NUM': '161202122', 'ORG_LGL_BUS_NAME': 'UNIVERSITY OF WISCONSIN SYSTEM', 'ORG_PRNT_DUNS_NUM': '041188822'}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
{'Code': '1441', 'Text': 'MECHANICS'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1987&All=true', 'xml': '8704867.xml'}