Chemical Imaging with the Stigmatic Ion Microscope
{'Code': '03090006', 'Directorate': {'LongName': 'Direct For Mathematical & Physical Scien'}, 'Division': {'LongName': 'Division Of Chemistry'}}
{'SignBlockName': 'Vickie Lewis'}
This project is in the general area of analytical and surface                   chemistry and in the subfield of secondary ion mass                             spectrometry (SIMS).  This research program will investigate                    the factors affecting practical SIMS microanalysis of                           semiconductor and electronic devices and of biological tissues.                 The goals of this program are (1) to improve the spatial                        resolution of the stigmatic secondary ion microscope through                    the use of a charge-coupled device detector and (2) to provide                  high-resolution quantitative mapping of elemental and isotopic                  distributions in solids.  The achievement of these goals will                   broaden the application of SIMS to many new important materials                 and biomedical problems.
{'FirstName': 'George', 'LastName': 'Morrison', 'EmailAddress': 'mh45@cornell.edu', 'StartDate': '02/15/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Cornell University', 'CityName': 'Ithaca', 'ZipCode': '148502820', 'PhoneNumber': '6072555014', 'StreetAddress': '373 Pine Tree Road', 'CountryName': 'United States', 'StateName': 'New York', 'StateCode': 'NY'}
[{'Code': '1972', 'Text': 'ELECTROCHEMISTRY & SURFACE CHE'}, {'Code': '1974', 'Text': 'ANALYTICAL SEPARATIONS & MEAS.'}]
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1987&All=true', 'xml': '8718831.xml'}