Evaluation of a New Technique For the Deposition of         Conductive Patterns and Contacts For Microelectronics
{'Code': '07010000', 'Directorate': {'Abbreviation': 'ENG', 'LongName': 'Directorate For Engineering'}, 'Division': {'Abbreviation': 'ECCS', 'LongName': 'Div Of Electrical, Commun & Cyber Sys'}}
{'SignBlockName': 'name not available'}
None
{'FirstName': 'Julius', 'LastName': 'Perel', 'EmailAddress': None, 'StartDate': '10/15/1982', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Phrasor Scientific Inc', 'CityName': 'Duarte', 'ZipCode': '91010', 'PhoneNumber': None, 'StreetAddress': None, 'CountryName': 'United States', 'StateName': 'California', 'StateCode': 'CA'}
{'Code': '5370', 'Text': 'SBIR/STTR Operations'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1982&All=true', 'xml': '8260262.xml'}