The Development of Dynamic X-Ray Diffraction to Study the Kinetics of Solid State Reactions
{'Code': '07020000', 'Directorate': {'LongName': 'Directorate For Engineering'}, 'Division': {'LongName': 'Div Of Chem, Bioeng, Env, & Transp Sys'}}
{'SignBlockName': 'Farley Fisher'}
In this research, a new technique (called Dynamic X-Ray Diffraction (DXRD) will be developed to study reaction kinetics in solid systems. Ideally, kinetic measurements should be done with techniques that are non-destructive, have low energy flux requirements, and can be used continuously or with very rapid repetition times compared to the half-life of the kinetic process. There are a number of spectroscopic techniques that meet these requirements in gaseous or liquid systems, but they usually work poorly, if at all, in solids. (An exception are those methods depending on magnetic properties, but these are limited to those few systems that show a change in type of magnetism present.)
{'FirstName': 'William', 'LastName': 'Thomson', 'EmailAddress': 'thomson@che.wsu.edu', 'StartDate': '06/01/1986', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Washington State University', 'CityName': 'PULLMAN', 'ZipCode': '991641060', 'PhoneNumber': '5093359661', 'StreetAddress': '280 Lighty', 'CountryName': 'United States', 'StateName': 'Washington', 'StateCode': 'WA'}
{'Code': '1401', 'Text': 'Catalysis'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1986&All=true', 'xml': '8611104.xml'}