Reliable Computers
{'Code': '05010600', 'Directorate': {'Abbreviation': 'CSE', 'LongName': 'Direct For Computer & Info Scie & Enginr'}, 'Division': {'Abbreviation': 'CCF', 'LongName': 'Division of Computing and Communication Foundations'}}
{'SignBlockName': 'Robert B Grafton', 'PO_EMAI': None, 'PO_PHON': None}
Professor McCluskey's research is in testing of VLSI circuits                   with a focus on topics in error detection and fault diagnosis.                  In error detection, he will study the phenomenon of transient                   errors by physical experiments, simulation and analysis.  He is                 also investigating error detection through methods which involve                verification of a problem answer.  In fault diagnosis, he is                    developing test and diagnostic procedures that provide guaranteed               fault coverage for various types of faults other than stuck-at                  faults.  These include bridging, intermittent and delay faults.                 Methods of generating test patterns to detect complex faults are                being investigated.  Research is aimed at better techniques for                 network segmentation, pattern generation for segments, and                      generation of patterns either on the chip, on board or by                       program.
{'FirstName': 'Edward', 'LastName': 'McCluskey', 'PI_MID_INIT': 'J', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Edward J McCluskey', 'EmailAddress': 'ejm@crc.stanford.edu', 'NSF_ID': '000154690', 'StartDate': '11/01/1987', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'Stanford University', 'CityName': 'STANFORD', 'ZipCode': '943052004', 'PhoneNumber': '6507232300', 'StreetAddress': '450 JANE STANFORD WAY', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'California', 'StateCode': 'CA', 'CONGRESSDISTRICT': '16', 'CONGRESS_DISTRICT_ORG': 'CA16', 'ORG_UEI_NUM': 'HJD6G4D6TJY5', 'ORG_LGL_BUS_NAME': 'THE LELAND STANFORD JUNIOR UNIVERSITY', 'ORG_PRNT_UEI_NUM': None}
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{'Code': '4710', 'Text': 'DES AUTO FOR MICRO & NANO SYS'}
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