Presidential Young Investigator Award: Microwave Time-of    Flight Measurements of Hot Electrons and Holes in Compound  Semiconductors
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A microwave time-of-flight system is built to measure carrier drift             velocities.  This system will consist of a scanning electron beam,              which scans across a Schottky barrier diode, generating a current.  By          using a microwave network analyser, the phase of this current can be            compared with a reference signal and used to determine the time                 required by the carriers so generated to cross the diode depletion              region.  As the depletion length and field are determined separately,           the average drift velocity can then be calculated.
{'FirstName': 'Robert', 'LastName': 'Grondin', 'PI_MID_INIT': 'O', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Robert O Grondin', 'EmailAddress': 'bob.grondin@asu.edu', 'NSF_ID': '000328892', 'StartDate': '06/15/1985', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
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{'Code': '1456', 'Text': 'SOLID-STATE&MICROSTRUCTURE RES'}
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