Non-Contact Pencil Probe for Advanced Manufacturing           Inspection
{'Code': '15030000', 'Directorate': {'Abbreviation': 'TIP', 'LongName': 'Dir for Tech, Innovation, & Partnerships'}, 'Division': {'Abbreviation': 'TI', 'LongName': 'Translational Impacts'}}
{'SignBlockName': 'Ritchie B. Coryell', 'PO_EMAI': None, 'PO_PHON': None}
This Phase II Small Business award is for continued research               needed to develop a highly accurate, miniature probe designed to                inspect manufactured parts of complex geometry.  The non-contacting             probe is based on laser technology and it should permit rapid and               accurate inspection of a wide class of workpieces with features such            as internal threads, shoulders, slots, and holes.
{'FirstName': 'Steven', 'LastName': 'Case', 'PI_MID_INIT': 'K', 'PI_SUFX_NAME': None, 'PI_FULL_NAME': 'Steven K Case', 'EmailAddress': None, 'PI_PHON': '8007466315', 'NSF_ID': '000332883', 'StartDate': '08/15/1988', 'EndDate': None, 'RoleCode': 'Principal Investigator'}
{'Name': 'CyberOptics Corporation', 'CityName': 'Minneapolis', 'ZipCode': '554143030', 'PhoneNumber': '6123315702', 'StreetAddress': '2331 University Avenue, SE', 'StreetAddress2': None, 'CountryName': 'United States', 'StateName': 'Minnesota', 'StateCode': 'MN', 'CONGRESSDISTRICT': '05', 'CONGRESS_DISTRICT_ORG': 'MN05', 'ORG_UEI_NUM': None, 'ORG_LGL_BUS_NAME': None, 'ORG_PRNT_UEI_NUM': None}
{'Name': None, 'CityName': None, 'StateCode': None, 'ZipCode': None, 'StreetAddress': None, 'CountryCode': None, 'CountryName': None, 'StateName': None, 'CountryFlag': None, 'CONGRESSDISTRICT': None, 'CONGRESS_DISTRICT_PERF': '""'}
{'Code': '5373', 'Text': 'SBIR Phase II'}
{'url': 'https://www.nsf.gov/awardsearch/download?DownloadFileName=1988&All=true', 'xml': '8801668.xml'}